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Titlebook: Kelvin Probe Force Microscopy; Measuring and Compen Sascha Sadewasser,Thilo Glatzel Book 2012 Springer-Verlag Berlin Heidelberg 2012 Kelvin

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書目名稱Kelvin Probe Force Microscopy
副標(biāo)題Measuring and Compen
編輯Sascha Sadewasser,Thilo Glatzel
視頻videohttp://file.papertrans.cn/543/542371/542371.mp4
概述First book dedicated soley to Kelvin force microscopy.Explains basics, realization, modulation and data interpretation.Provides important application examples.Useful reference to researchers and gradu
叢書名稱Springer Series in Surface Sciences
圖書封面Titlebook: Kelvin Probe Force Microscopy; Measuring and Compen Sascha Sadewasser,Thilo Glatzel Book 2012 Springer-Verlag Berlin Heidelberg 2012 Kelvin
描述.Over?the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert..
出版日期Book 2012
關(guān)鍵詞Kelvin probe microscopy; Nanotechnology; Scanning probe microscopy; Surface potential; Surface science
版次1
doihttps://doi.org/10.1007/978-3-642-22566-6
isbn_softcover978-3-642-27113-7
isbn_ebook978-3-642-22566-6Series ISSN 0931-5195 Series E-ISSN 2198-4743
issn_series 0931-5195
copyrightSpringer-Verlag Berlin Heidelberg 2012
The information of publication is updating

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0931-5195 s. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert..978-3-642-27113-7978-3-642-22566-6Series ISSN 0931-5195 Series E-ISSN 2198-4743
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Springer Series in Surface Scienceshttp://image.papertrans.cn/k/image/542371.jpg
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https://doi.org/10.1007/978-3-642-22566-6Kelvin probe microscopy; Nanotechnology; Scanning probe microscopy; Surface potential; Surface science
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Kelvin Probe Force Microscopy978-3-642-22566-6Series ISSN 0931-5195 Series E-ISSN 2198-4743
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of applied therapeutics, and concepts of temporal, spatial This book approaches the subject from a mechanistic perspective that pitches the language at a level that is understandable to those entering the field and who are not familiar with its common phrases or complex terms. It provides a simple
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