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Titlebook: Ion Spectroscopies for Surface Analysis; A. W. Czanderna,David M. Hercules Book 1991 Springer Science+Business Media New York 1991 Atom.Ch

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書目名稱Ion Spectroscopies for Surface Analysis
編輯A. W. Czanderna,David M. Hercules
視頻videohttp://file.papertrans.cn/476/475183/475183.mp4
叢書名稱Methods of Surface Characterization
圖書封面Titlebook: Ion Spectroscopies for Surface Analysis;  A. W. Czanderna,David M. Hercules Book 1991 Springer Science+Business Media New York 1991 Atom.Ch
描述Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. At present, many ap- proaches may be applied for measuring the elemental and molecular composition of a surface. Each method has particular strengths and limitations that often are directly connected to the physical processes involved. Typically, atoms and molecules on the surface and in the near surface region may be excited by photons, electrons, ions, or neutrals, and the detected particles are emitted, ejected, or scattered ions or electrons. The purpose of this book is to bring together a discussion of the surface compositional analysis that depends on detecting scattered or sputtered ions, and the methods emphasized are those where instruments are commercially available for carrying out the analysis. For each topic treated, the physical principles, instrumentation, qualitative analysis, artifacts, quantitative analysis, applications, opportunities, and limita- tions are discussed. The first chapter provides an overview of the role of elemental composition in surface science; compositional depth profiling; stimulation by an electric field, electrons, neutrals, or pho
出版日期Book 1991
關(guān)鍵詞Atom; Chromat; Diffusion; X-ray; chromatography; crystal; electron; metals; photoelectron spectroscopy; polym
版次1
doihttps://doi.org/10.1007/978-1-4615-3708-3
isbn_softcover978-1-4613-6649-2
isbn_ebook978-1-4615-3708-3
copyrightSpringer Science+Business Media New York 1991
The information of publication is updating

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Surface Structure and Reaction Studies by Ion-Solid Collisions, this approach, the kinetic energy of the primary particle, typically a few eV to a few thousand eV, exceeds the binding interactions normally present in chemical bonds. Because of this energy difference, a novel and intriguing chain of events is rapidly set in motion subsequent to the impact event.
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Particle-Induced Desorption Ionization Techniques for Organic Mass Spectrometry,e analytical method for nonvolatile and thermally labile compounds, including those of high molecular weight such as biomolecules, has encouraged such development. The prospect of largescale manufacture of synthetic biomolecules, with its concomitant need for analytical methods, ensures the continue
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Laser Resonant and Nonresonant Photoionization of Sputtered Neutrals, of the work discussed here, first note the initial experiments on sputtering performed in 1910 by J.J. Thomson.. In that early work Thomson sputtered a cathode and noted that some of the sputterd atoms were in a charged state while the majority were neutral in charge. After many years of general in
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Ion Scattering Spectroscopy,e. A low-energy ion beam is a well-suited probe for such investigations because of the strong interaction between the ions in the considered energy regime and the surface atoms. “Low-energy” here refers to a range from a few hundred electron volts up to several keV. There are some essential features
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Comparisons of SIMS, SNMS, ISS, RBS, AES, and XPS Methods for Surface Compositional Analysis, SNMS, ISS, RBS, AES, and XPS) in tabular form and in brief narratives. It is assumed that the reader is familiar with the principles of these techniques. Detailed information on the ion spectroscopies (SIMS, SNMS, ISS, and RBS) is presented in earlier chapters of this volume; information on the ele
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https://doi.org/10.1007/978-1-4615-3708-3Atom; Chromat; Diffusion; X-ray; chromatography; crystal; electron; metals; photoelectron spectroscopy; polym
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