Titlebook: Ion Beam Surface Layer Analysis; Volume 1 O. Meyer,G. Linker,F. K?ppeler Book 1976 Springer Science+Business Media New York 1976 Cross sect

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Energy Straggling of 4He Ions in Al and Cu in the Backscattering Geometry recorded from samples where a thin gold film was covered with aluminum or copper films of different thicknesses. The effect of energy straggling was determined from the broadening of the Au peak. The primary energies of He ions were varied between 0.5 and 2.0 MeV. To determine the thicknesses of th

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Determining Concentration vs. Depth Profiles from Backscattering Spectra without Using Energy Loss Vrgy rather than the energy measured at the detector. This is done by assuming depth-independent values, for each element, for the quantity (energy loss after collision) ÷ (energy loss before collision). Once these profiles are obtained, a profile of composition vs. collision energy follows directly

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Comparative Analysis of Surface Layers by Backscattering and by Auger Electron Spectroscopytem); compound formation (Cr-Al system); and inter-diffusion of two metals (Au-Ni system). The backscattering methods, which are nondestructive, provide measurements of thickness and concentration, with an accuracy of 5% and a depth resolution of about 200 ? in the near surface region when a solid-s

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Analyzing the Formation of a thin Compound Film by Taking Moments on Backscattering Spectracomparable to the depth resolution of the instrument. This paper describes a method of circumventing this difficulty by using the change that takes place in the moment of the distribution of a given element. The growth of the compound layer is proportional to the square root of the change of moment

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Near-Surface Investigation by Backscattering of N+Ions and Grazing Angle Beam Incidenceyzing ions is investigated. As detector resolution, stopping power, energy straggling and multiple scattering effects are involved in resolution, these data were measured for He. and N. ions of energy 1,3 MeV on thin W layers. The geometrical effect is found to be by far more efficient than heavy io

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