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Titlebook: Introduction to Quantum Metrology; Quantum Standards an Waldemar Nawrocki Book 20151st edition Springer International Publishing Switzerlan

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21#
發(fā)表于 2025-3-25 05:55:32 | 只看該作者
Quantization of Electrical and Thermal Conductance in Nanostructures,fied experimentally. Conductance quantization in nanostructures is used in the analysis of large-scale integration circuits, as required by the currently used 14?nm technology and future technologies.
22#
發(fā)表于 2025-3-25 09:12:06 | 只看該作者
Standards and Measurements of Length,igation and positioning, GPS, GLONASS and Galileo (under development), and point out the differences between them. Finally, we have a cursory look at three regional navigation systems, the Chinese BeiDou, the Indian IRNSS, and the Japanese QZSS.
23#
發(fā)表于 2025-3-25 13:48:10 | 只看該作者
Scanning Probe Microscopes,f scanning microscopes. In this chapter we discuss also the atomic force microscope (AFM), electrostatic force microscope (EFM), scanning thermal microscope (SThM) and scanning near-field optical microscope (SNOM). We also present a wide range of current and prospective applications of scanning microscopes.
24#
發(fā)表于 2025-3-25 16:00:04 | 只看該作者
25#
發(fā)表于 2025-3-25 21:20:42 | 只看該作者
Book 20151st editionbook provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with m
26#
發(fā)表于 2025-3-26 03:32:59 | 只看該作者
Waldemar NawrockiGives an introduction to quantum effects in metrology and quantum electronics.Explains standards for quantum measurements.Contains many applications and exercises for electrical quantities, mass, leng
27#
發(fā)表于 2025-3-26 07:14:24 | 只看該作者
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28#
發(fā)表于 2025-3-26 11:34:33 | 只看該作者
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30#
發(fā)表于 2025-3-26 20:17:28 | 只看該作者
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