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Titlebook: Introduction to Quantum Metrology; The Revised SI Syste Waldemar Nawrocki Book 2019Latest edition Springer Nature Switzerland AG 2019 Atomi

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11#
發(fā)表于 2025-3-23 11:21:53 | 只看該作者
,The New SI System of Units—The SI of 2018, of a quantum standard of the unit of mass. The practical realization (.) of any unit generally means establishment the value and associated uncertainty of a quantity of the unit of the same kind. . for realization of the units of the SI were prepared by the Consultive Committees of the CIPM. They are presented in Sects.?.–..
12#
發(fā)表于 2025-3-23 14:44:43 | 只看該作者
Quantum Voltage Standards,lternating-voltage standards with Josephson junctions: binary divided junction arrays and pulse-driven junction arrays. Also presented are the principles of operation of the memory cell and flip-flop, basic components in digital cryoelectronics.
13#
發(fā)表于 2025-3-23 19:27:07 | 只看該作者
14#
發(fā)表于 2025-3-23 22:25:30 | 只看該作者
Scanning Probe Microscopes,f scanning microscopes. In this chapter we discuss also the atomic force microscope (AFM), electrostatic force microscope (EFM), scanning thermal microscope (SThM) and scanning near-field optical microscope (SNOM). We also present a wide range of current and prospective applications of scanning microscopes.
15#
發(fā)表于 2025-3-24 02:27:22 | 只看該作者
Quantum Hall Effect and the Resistance Standard,nner with a step of ./2. representing the conductance quantum. The quantization of electrical and thermal conductance in nanostructures has been verified experimentally. Conductance quantization in nanostructures is used in the analysis of large-scale integration circuits, as required by the currently used 14?nm technology and future technologies.
16#
發(fā)表于 2025-3-24 09:17:10 | 只看該作者
Quantization of Electrical and Thermal Conductance in Nanostructures,nner with a step of ./2. representing the conductance quantum. The quantization of electrical and thermal conductance in nanostructures has been verified experimentally. Conductance quantization in nanostructures is used in the analysis of large-scale integration circuits, as required by the currently used 14?nm technology and future technologies.
17#
發(fā)表于 2025-3-24 14:13:59 | 只看該作者
Single Electron Tunneling,. We discuss the attempts to construct a direct-current standard with SET junctions and explain why the results are unsatisfactory. We also describe two SET systems of more practical importance: the electron-counting capacitance standard (ECCS) and the Coulomb blockade thermometer (CBT).
18#
發(fā)表于 2025-3-24 18:40:36 | 只看該作者
19#
發(fā)表于 2025-3-24 20:53:09 | 只看該作者
20#
發(fā)表于 2025-3-25 00:55:21 | 只看該作者
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