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Titlebook: Integration of Functional Oxides with Semiconductors; Alexander A. Demkov,Agham B. Posadas Book 2014 The Author(s) 2014 Covalent and ionic

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書目名稱Integration of Functional Oxides with Semiconductors
編輯Alexander A. Demkov,Agham B. Posadas
視頻videohttp://file.papertrans.cn/469/468846/468846.mp4
概述Discusses why semiconductor substrates are an excellent integration platform for making hybrid logic/sensor devices.Provides a brief introduction to the methods accessible to non-experts, before going
圖書封面Titlebook: Integration of Functional Oxides with Semiconductors;  Alexander A. Demkov,Agham B. Posadas Book 2014 The Author(s) 2014 Covalent and ionic
描述This book?describes the basic physical principles of the oxide/semiconductor epitaxy and offers a view of the current state of the field. It shows how this technology enables large-scale integration of oxide electronic and photonic devices and describes possible hybrid semiconductor/oxide systems. The book incorporates both theoretical and experimental advances to explore the heteroepitaxy of tuned functional oxides and semiconductors to identify material, device and characterization challenges and to present the incredible potential in the realization of multifunctional devices and monolithic integration of materials and devices. Intended for a multidisciplined audience, .Integration of Functional Oxides with Semiconductors. describes processing techniques that enable atomic-level control of stoichiometry and structure and reviews characterization techniques for films, interfaces and device performance parameters. Fundamental challenges involved in joining covalent and ionic systems, chemical interactions at interfaces, multi-element materials that are sensitive to atomic-level compositional and structural changes are discussed in the context of the latest literature. Magnetic, fe
出版日期Book 2014
關(guān)鍵詞Covalent and ionic systems; Epitaxy; Functional oxides; Semiconductors
版次1
doihttps://doi.org/10.1007/978-1-4614-9320-4
isbn_softcover978-1-4939-4169-8
isbn_ebook978-1-4614-9320-4
copyrightThe Author(s) 2014
The information of publication is updating

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Thin Oxide Film Characterization Methods,ormed in order to gain a more complete picture of the sample being measured. The chapter is primarily designed to introduce thin film growth practitioners to the most common characterization methods available and what types of information can be obtained from them.
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Introduction,s and covalent semiconductors. In this chapter we briefly introduce the various classes of materials one has to deal with and their general properties. In particular, we discuss semiconductors, transition metal oxides, and Zintl intermetallics.
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