Titlebook: Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation; 17th International W Nadine Azémard,Lars Sven

拖累

書目名稱Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation影響因子(影響力)




書目名稱Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation影響因子(影響力)學(xué)科排名




書目名稱Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation網(wǎng)絡(luò)公開(kāi)度




書目名稱Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation網(wǎng)絡(luò)公開(kāi)度學(xué)科排名




書目名稱Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation被引頻次




書目名稱Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation被引頻次學(xué)科排名




書目名稱Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation年度引用




書目名稱Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation年度引用學(xué)科排名




書目名稱Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation讀者反饋




書目名稱Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation讀者反饋學(xué)科排名

使厭惡

Design of a Linear Power Amplifier with ±1.5V Power Supply Using ALADINntegrated into the ALADIN package, which allows designers to create analog circuit layouts automatically. The optimization is speeded up and the reliability of the design is improved. The benefit of ALADIN is demonstrated with the design of a linear power amplifier with ±1.5V power supply.

mydriatic

A Simple Statistical Timing Analysis Flow and Its Application to Timing Margin Evaluationiming analysis method considering the lot to lot process shifts occurring during production. This method is first validated for 90nm and 65nm processes. Finally, this statistical timing analysis is applied on basic ring oscillators to evaluate the timing margins introduced at the design level by the traditional corner based approach.

Cantankerous

Design-In Reliability for 90-65nm CMOS Nodes Submitted to Hot-Carriers and NBTI Degradation due to Hot Carrier and Negative Bias Temperature Instability. Simulation capability has been built on top of an existing analog simulator ELDO. Circuits are analyzed using this methodology illustrating the capabilities of the methodology as well highlighting the impacts of the two degradations modes.

exhibit

978-3-540-74441-2Springer-Verlag Berlin Heidelberg 2007

Grasping

GLUT

Lecture Notes in Computer Sciencehttp://image.papertrans.cn/i/image/468458.jpg

perjury

System-Level Application-Specific NoC Design for Network and Multimedia Applicationsimplementing complex applications on Network-on-Chips (NoCs), a design methodology is needed for performing exploration at NoC system-level, in order to select the optimal application-specific NoC architecture. The design methodology we present in this paper is based on the exploration of different

強(qiáng)制性

Fast and Accurate Embedded Systems Energy Characterization Using Non-intrusive Measurementse simulation tools to give energy consumption feedback for embedded systems software design. Estimations takes into account the whole system consumption including peripherals. Experiments on a complex ARM9 platform show that our model estimates are in error by less than 10% from real system consumpt

conformity