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Titlebook: Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation; 16th International W Johan Vounckx,Nadine Aze

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書目名稱Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation
副標(biāo)題16th International W
編輯Johan Vounckx,Nadine Azemard,Philippe Maurine
視頻videohttp://file.papertrans.cn/469/468456/468456.mp4
叢書名稱Lecture Notes in Computer Science
圖書封面Titlebook: Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation; 16th International W Johan Vounckx,Nadine Aze
描述Welcome to the proceedings of PATMOS 2006, the 16th in a series of international workshops. PATMOS 2006 was organized by LIRMM with CAS technical - sponsorship and CEDA sponsorship. Over the years, the PATMOS workshop has evolved into an important European event, where researchers from both industry and academia discuss and investigate the emerging challenges in future and contemporary applications, design methodologies, and tools required for the development of upcoming generations of integrated circuits and systems. The technical program of PATMOS 2006 contained state-of-the-art technical contributions, three invited talks, a special session on hearing-aid design, and an embedded tutorial. The technical program focused on timing, performance and power consumption, as well as architectural aspects with particular emphasis on modeling, design, characterization, analysis and optimization in the nanometer era. The Technical Program Committee, with the assistance of additional expert reviewers, selected the 64 papers presented at PATMOS. The papers were organized into 11 technical sessions and 3 poster sessions. As is always the case with the PATMOS workshops, full papers were require
出版日期Conference proceedings 2006
關(guān)鍵詞DOM; calculus; circuit design; configuration; electromagnetic compatibility; field-effect transistor; inte
版次1
doihttps://doi.org/10.1007/11847083
isbn_softcover978-3-540-39094-7
isbn_ebook978-3-540-39097-8Series ISSN 0302-9743 Series E-ISSN 1611-3349
issn_series 0302-9743
copyrightSpringer-Verlag Berlin Heidelberg 2006
The information of publication is updating

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Leakage Power Characterization Considering Process Variationsriations. The model developed shows that, even if channel length variations are kept small the leakage dispersion is considerably large. Finally, the concept of “Hot Gates” (HGs) is introduced, showing that HGs will be an important reliability factor in near future nanometer technologies.
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Low-Power Adaptive Bias Amplifier for a Large Supply-Range Linear Voltage Regulator stage approach solves the contradictory requirements for low and high supply voltages, reduces the amplifier power consumption to less than 1.35 % of the load current and shows good regulator stability in spite of an increased number of poles.
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