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Titlebook: Integrated Circuit and System Design: Power and Timing Modeling, Optimization and Simulation; 19th International W José Monteiro,René Leuke

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21#
發(fā)表于 2025-3-25 04:20:00 | 只看該作者
Robust Low Power Embedded SRAM Design: From System to Memory Cellscaling for some time was a natural part of technology scaling, which automatically resulted in power reduction. For sub-100nm technologies it has been difficult to reduce active power consumption for SRAMs, because the amount of memory in digital ICs is still increasing and the memory bit cell does
22#
發(fā)表于 2025-3-25 08:29:01 | 只看該作者
Variability in Advanced Nanometer Technologies: Challenges and SolutionsDue to the difficulty in process control in advanced nanometer technologies, manufacturing-induced variations are growing both in number and as a percentage of device feature sizes, and a deep understanding of the different sources of variation, along with their characterization and modeling, has be
23#
發(fā)表于 2025-3-25 14:41:56 | 只看該作者
Subthreshold Circuit Design for Ultra-Low-Power Applicationsting in weak inversion (subthreshold) regime. Minimum size pMOS transistors with shorted drain-substrate contacts are used as gate-controlled, very high resistivity load devices. Based on the proposed approach, the power consumption and the operation frequency of logic circuits can be scaled down li
24#
發(fā)表于 2025-3-25 17:24:23 | 只看該作者
25#
發(fā)表于 2025-3-25 23:19:27 | 只看該作者
26#
發(fā)表于 2025-3-26 03:35:52 | 只看該作者
27#
發(fā)表于 2025-3-26 04:31:53 | 只看該作者
28#
發(fā)表于 2025-3-26 10:03:47 | 只看該作者
Exponent Monte Carlo for Quick Statistical Circuit Simulationr verifying high circuit yield in the presence of random process variations. Results on industry-grade standard cell netlists and compact models in 45nm show that EMC predicts reasonable results at least 1,000 times faster than MC.
29#
發(fā)表于 2025-3-26 15:40:22 | 只看該作者
Clock Repeater Characterization for Jitter-Aware Clock Tree Synthesison in current clock tree synthesis algorithms. It is based on the timing characterization of a reference inverter, which can be performed for different process corners to account for process variability. Simulation results show that the model is accurate to within 10% for the most common inverter an
30#
發(fā)表于 2025-3-26 19:12:36 | 只看該作者
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