Titlebook: Ignorance and Uncertainty; Emerging Paradigms Michael Smithson Book 1989 Springer-Verlag New York Inc. 1989 behavior.control.heuristics.org

SHRIK

978-0-387-96945-9Springer-Verlag New York Inc. 1989

整潔

Ignorance and Uncertainty978-1-4612-3628-3Series ISSN 1431-1887

光亮

Acclaim

褲子

John Andradeant issue at the confluence of thesetwo branches of philosophy, namely: Can we .know. facts fromreliable reports? Besides Hume‘s subversive discussion of miracles andthe literature thereon, testimony has been bypassed by most Westernphilosophers; whereas in classical Indian (Pramana) theories ofevid

柔軟

Evaluation for Effective Use of Dredged Soil as Containment Dikes of Disposal Pondji-Oki disposal pond (S-3) 9?years ago. Since this sample is an artificial material, its long-term stability has not been confirmed. In order to understand the evolution of the properties of the constructed revetment over time, mechanical tests, such as direct shear tests, have been conducted on blo

Acclaim

Searching Cellular Automata Rules for Solving Two-Dimensional Binary Classification Problemsional, three-state cellular automaton (CA) with the von Neumann neighborhood. Since the number of possible CA rules (potential CA-based classifiers) is huge, searching efficient rules is conducted with use of a genetic algorithm (GA). Experiments show an very good performance of discovered rules in

Living-Will

Demonstrate

The Limits of Prediction (Part A): A Futile Pursuit?, or make algorithms that learn from data. It’s natural for someone to ask, what exactly . we predict and what can’t we? How can we have faith in our predictions? What are the limits of our knowledge? Is it always the case that we won’t know what we don’t know, or can we, at least, get an understandi

詞根詞綴法

Variability in Nanoscale FinFET Technologies,e edge roughness (LER), random dopant fluctuation (RDF), oxide thickness fluctuation (OTF), and work function variation (WFV) can significantly affect the performance of individual transistors through random variations in device metrics such as threshold voltage (. .), on-state drive current (. .),