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Titlebook: IC Interconnect Analysis; Mustafa Celik,Lawrence Pileggi,Altan Odabasioglu Book 2002 Springer Science+Business Media New York 2002 automat

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樓主: genial
21#
發(fā)表于 2025-3-25 04:25:43 | 只看該作者
22#
發(fā)表于 2025-3-25 07:58:23 | 只看該作者
Introduction,se techniques range from very simple delay metrics that can be used during the synthesis stage of IC design; to higher order delay and signal integrity metrics suitable for physical design; and conclude with accurate analysis methods that can be utilized in the final verification stages of chip desi
23#
發(fā)表于 2025-3-25 12:36:36 | 只看該作者
24#
發(fā)表于 2025-3-25 18:30:13 | 只看該作者
Higher-Order RC(L) Delay Metrics,nd RC impulse responses. In addition, other interesting properties of moments were shown to facilitate approximations of RLC interconnect damping control, cross-talk estimation, and steady-state phase delay prediction. While these metrics extend the utility of moments for performance prediction, lik
25#
發(fā)表于 2025-3-25 22:02:08 | 只看該作者
26#
發(fā)表于 2025-3-26 00:53:40 | 只看該作者
Moment Generation, optimum efficiency for RLC tree-like interconnect structures, and for many interconnect topologies that contain resistor loops. The MNA formulation, in addition to being general and very simple to implement, can provide excellent runtime efficiency when combined with sparse matrix techniques and sp
27#
發(fā)表于 2025-3-26 08:08:15 | 只看該作者
28#
發(fā)表于 2025-3-26 09:40:31 | 只看該作者
Interfacing with SPICE,ding a statespace realization of the reduced order model. We have shown that once such a realization is obtained, it can be synthesized with an equivalent circuit so that any circuit simulator can be used. The second method, based on the recursive convolution, requires a modification in the simulato
29#
發(fā)表于 2025-3-26 14:41:50 | 只看該作者
Interfacing Interconnect and Gate-Delay Models,oise was also explored and methodologies were proposed to measure the delay and noise impact under a static timing analysis context. The reader should be warned that the gate delay modeling remains an ongoing research problem and may continue to evolve as new technologies emerge.
30#
發(fā)表于 2025-3-26 19:06:05 | 只看該作者
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