Titlebook: High-Risk Sexual Behavior; Interventions with V Evvie Becker,Elizabeth Rankin,Annette U. Rickel Book 1998 Springer Science+Business Media N

合適

ts the unwanted but unavoidable oxide defects leading to charge traps and presents activation mechanisms. These defects can lead to a variety of known ageing effects, such as negative/positive bias instability, hot carrier degradation (alias hot carrier injection), random telegraph noise and time-de