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Titlebook: High-Resolution Imaging and Spectrometry of Materials; Frank Ernst,Manfred Rühle Book 2003 Springer-Verlag Berlin Heidelberg 2003 AFM.STM.

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書目名稱High-Resolution Imaging and Spectrometry of Materials
編輯Frank Ernst,Manfred Rühle
視頻videohttp://file.papertrans.cn/427/426725/426725.mp4
概述In contrast to previously available books this not only reports on the state of the art of advanced electron microscopy but also contains examples of applications.Includes supplementary material:
叢書名稱Springer Series in Materials Science
圖書封面Titlebook: High-Resolution Imaging and Spectrometry of Materials;  Frank Ernst,Manfred Rühle Book 2003 Springer-Verlag Berlin Heidelberg 2003 AFM.STM.
描述The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at "critical" regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma- terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation
出版日期Book 2003
關(guān)鍵詞AFM; STM; Transmission; advanced electron optics; coherent electron techniques; composite; electron micros
版次1
doihttps://doi.org/10.1007/978-3-662-07766-5
isbn_softcover978-3-642-07525-4
isbn_ebook978-3-662-07766-5Series ISSN 0933-033X Series E-ISSN 2196-2812
issn_series 0933-033X
copyrightSpringer-Verlag Berlin Heidelberg 2003
The information of publication is updating

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Scanning Tunneling Microscopy (STM) and Spectroscopy (STS), Atomic Force Microscopy (AFM),xtremely sophisticated nor expensive, numerous of groups embarked on STM work right after the first publications had appeared and contributed to the development of this technique. This was certainly very different from electron microscopy which, for decades remained a subject for specialists and relied upon demanding equipment.
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From Microcharacterization to Macroscopic Property: A Pathway Discussed on Metal/Ceramic Composites described and the prospects for the near and far future were presented. While these achievements are spectacular and noteworthy as a fundamental achievement in basic science in its own right, without correlation to any macroscopic property, they may remain a mere academic exercise without apparent consequence.
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https://doi.org/10.1007/978-3-662-07766-5AFM; STM; Transmission; advanced electron optics; coherent electron techniques; composite; electron micros
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