| 書目名稱 | High-Resolution Electron Microscopy for Materials Science | | 編輯 | Daisuke Shindo,Kenji Hiraga | | 視頻video | http://file.papertrans.cn/427/426721/426721.mp4 | | 圖書封面 |  | | 描述 | High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM. | | 出版日期 | Book 1998 | | 關(guān)鍵詞 | advanced materials; ceramics; electron microscopy; materials science; microscopy; simulation | | 版次 | 1 | | doi | https://doi.org/10.1007/978-4-431-68422-0 | | isbn_softcover | 978-4-431-70234-4 | | isbn_ebook | 978-4-431-68422-0 | | copyright | Springer-Verlag Tokyo 1998 |
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