Titlebook: High-Frequency Circuit Design and Measurements; Peter C. L. Yip Book 1990 P. Yip 1990 circuit design.noise.stability

ambivalence

e to the growing need of local industry for graduate engineers capable of designing circuits and performing measurements at high frequencies up to a few gigahertz. This book has grown out from the lecture and tutorial materials written specifically for this course. This course should, in the opinion

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Microwave Frequency Counting,y. Being a digital instrument, the frequency range that a frequency counter can measure is limited by the speed of its logic circuitry. A state-of-the-art counter with emitter-coupled-logic (ECL) components can count directly up to around 1 GHz.

Ordnance

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Inkling

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Basic Concepts and Elementary Models,own that the modifications have no influence on the fatigue behavior. The DOFS allows to measure with a high spatial resolution, where the conventional method only acquires one value per time step. The horizontal strain function of an undamaged MS in dependence of time and space in the CITT can be p

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Richard Jessortailed investigation into the logical foundations of specification and specification languages and their application to the definition of programming languages, coupled with a clear exposition of theories of data and computable models as mathematical notions will be welcomed by researchers and graduate students..978-1-84996-818-8978-1-84882-052-4

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IoT-Watcher: A Climate Monitoring System for?IT Infrastructures Based on?IoT and?Open-Source Technologiesy of monitoring virtually any parameter administrators may think of..The hardware devices designed have been tested and we show data comparing our system with data obtained from the actual CITIC Data Center’s monitoring system, a proprietary solution, so we can offer a correlation between these two systems.

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0177-2783 den hier sich nach der Philosophie Cassirers entwickelt, entspricht. Diese Reflexion bietet sowohl eine neue Lesart der Casssirerschen Philosophie, als auch wichtige theoretische Brennpunkte für die Bereichen der Bildwissenschaft, Kunst- und Kulturphilosophie.978-3-86226-136-9978-3-86226-975-4Series ISSN 0177-2783