Titlebook: High Performance Memory Testing; Design Principles, F R. Dean Adams Book 2003 Springer Science+Business Media New York 2003 design.developm

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書目名稱High Performance Memory Testing影響因子(影響力)




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書目名稱High Performance Memory Testing網(wǎng)絡(luò)公開度




書目名稱High Performance Memory Testing網(wǎng)絡(luò)公開度學(xué)科排名




書目名稱High Performance Memory Testing被引頻次




書目名稱High Performance Memory Testing被引頻次學(xué)科排名




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書目名稱High Performance Memory Testing年度引用學(xué)科排名




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Book 2003its on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. .High Performance Memory Testing: Design Principles, Fault Modeling and Self Test. is based on the

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Silicon On Insulator Memories type stored in the cells along a column. The impact of history on cell stability must be considered as well. With careful design and test, performance advantages can be gained and robust circuitry can be implemented in silicon-on-insulator technology.

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BIST Conceptstimal test patterns..The BIST can be designed as a finite state machine or it can be designed as a micro-code BIST. These two types will be covered in the next chapters. Following this will be a discussion of how BIST handles redundancy and of other design-for-test and BIST techniques which help in the test of memories.

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stability–instability conditions, and bifurcation analysis are demonstrated in this work. All the analytical findings are verified with numerical simulations. Additionally, a model comparison is performed which helps to understand the dynamical changes due to nonlinear refuge.