找回密碼
 To register

QQ登錄

只需一步,快速開始

掃一掃,訪問微社區(qū)

打印 上一主題 下一主題

Titlebook: Advances in Electronic Testing; Challenges and Metho Dimitris Gizopoulos Book 2006 Springer-Verlag US 2006 Advances in Testing.CMOS.Electro

[復(fù)制鏈接]
查看: 51102|回復(fù): 38
樓主
發(fā)表于 2025-3-21 16:46:21 | 只看該作者 |倒序瀏覽 |閱讀模式
書目名稱Advances in Electronic Testing
副標(biāo)題Challenges and Metho
編輯Dimitris Gizopoulos
視頻videohttp://file.papertrans.cn/386/385807/385807.mp4
概述First book that reviews a comprehensive set of advanced electronic testing topics.Hot" topics of current interest to test technology community has been selected.Authors are key contributors in the cor
叢書名稱Frontiers in Electronic Testing
圖書封面Titlebook: Advances in Electronic Testing; Challenges and Metho Dimitris Gizopoulos Book 2006 Springer-Verlag US 2006 Advances in Testing.CMOS.Electro
描述.Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today’s state of the art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey...The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mex
出版日期Book 2006
關(guān)鍵詞Advances in Testing; CMOS; Electronic Circuits Testing; Hardware; Integrated Circuits; Microelectronics M
版次1
doihttps://doi.org/10.1007/0-387-29409-0
isbn_softcover978-1-4899-8773-0
isbn_ebook978-0-387-29409-4Series ISSN 0929-1296
issn_series 0929-1296
copyrightSpringer-Verlag US 2006
The information of publication is updating

書目名稱Advances in Electronic Testing影響因子(影響力)




書目名稱Advances in Electronic Testing影響因子(影響力)學(xué)科排名




書目名稱Advances in Electronic Testing網(wǎng)絡(luò)公開度




書目名稱Advances in Electronic Testing網(wǎng)絡(luò)公開度學(xué)科排名




書目名稱Advances in Electronic Testing被引頻次




書目名稱Advances in Electronic Testing被引頻次學(xué)科排名




書目名稱Advances in Electronic Testing年度引用




書目名稱Advances in Electronic Testing年度引用學(xué)科排名




書目名稱Advances in Electronic Testing讀者反饋




書目名稱Advances in Electronic Testing讀者反饋學(xué)科排名




單選投票, 共有 1 人參與投票
 

0票 0.00%

Perfect with Aesthetics

 

1票 100.00%

Better Implies Difficulty

 

0票 0.00%

Good and Satisfactory

 

0票 0.00%

Adverse Performance

 

0票 0.00%

Disdainful Garbage

您所在的用戶組沒有投票權(quán)限
沙發(fā)
發(fā)表于 2025-3-21 22:17:02 | 只看該作者
Failure Mechanisms and Testing in Nanometer Technologies,
板凳
發(fā)表于 2025-3-22 02:09:30 | 只看該作者
Book 2006-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mex
地板
發(fā)表于 2025-3-22 08:03:13 | 只看該作者
978-1-4899-8773-0Springer-Verlag US 2006
5#
發(fā)表于 2025-3-22 10:26:52 | 只看該作者
Advances in Electronic Testing978-0-387-29409-4Series ISSN 0929-1296
6#
發(fā)表于 2025-3-22 14:41:53 | 只看該作者
7#
發(fā)表于 2025-3-22 21:02:36 | 只看該作者
Dimitris GizopoulosFirst book that reviews a comprehensive set of advanced electronic testing topics.Hot" topics of current interest to test technology community has been selected.Authors are key contributors in the cor
8#
發(fā)表于 2025-3-23 00:10:45 | 只看該作者
9#
發(fā)表于 2025-3-23 05:16:54 | 只看該作者
Book 2006d to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology,
10#
發(fā)表于 2025-3-23 06:13:53 | 只看該作者
Ernst von Glaserfeldte spaces in Kenya and compares it with other frameworks adopted by African countries and other selected countries globally. The paper further gives recommendations on the path to adoption and implementation of the dynamic spectrum management for national regulatory authorities in Africa.
 關(guān)于派博傳思  派博傳思旗下網(wǎng)站  友情鏈接
派博傳思介紹 公司地理位置 論文服務(wù)流程 影響因子官網(wǎng) 吾愛論文網(wǎng) 大講堂 北京大學(xué) Oxford Uni. Harvard Uni.
發(fā)展歷史沿革 期刊點評 投稿經(jīng)驗總結(jié) SCIENCEGARD IMPACTFACTOR 派博系數(shù) 清華大學(xué) Yale Uni. Stanford Uni.
QQ|Archiver|手機(jī)版|小黑屋| 派博傳思國際 ( 京公網(wǎng)安備110108008328) GMT+8, 2025-10-14 22:49
Copyright © 2001-2015 派博傳思   京公網(wǎng)安備110108008328 版權(quán)所有 All rights reserved
快速回復(fù) 返回頂部 返回列表
渭源县| 呼伦贝尔市| 美姑县| 吴堡县| 崇文区| 济宁市| 玛多县| 鹤庆县| 伊宁市| 东港市| 乌拉特后旗| 襄垣县| 高平市| 三穗县| 团风县| 荥经县| 高碑店市| 洛川县| 巴楚县| 正镶白旗| 久治县| 上杭县| 临江市| 富顺县| 天气| 遵义市| 济南市| 汉沽区| 柞水县| 清徐县| 祁门县| 龙里县| 澎湖县| 南昌县| 嵩明县| 隆昌县| 富顺县| 响水县| 临桂县| 堆龙德庆县| 和林格尔县|