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Titlebook: GaP Heteroepitaxy on Si(100); Benchmarking Surface Henning D?scher Book 2013 Springer International Publishing Switzerland 2013 Anti-phase

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書目名稱GaP Heteroepitaxy on Si(100)
副標(biāo)題Benchmarking Surface
編輯Henning D?scher
視頻videohttp://file.papertrans.cn/381/380204/380204.mp4
概述Winner of a 2012 German Physical Society Dissertation Award.An important contribution to improving optoelectronic devices and performance of photovoltaic materials.Interesting for all experimentalists
叢書名稱Springer Theses
圖書封面Titlebook: GaP Heteroepitaxy on Si(100); Benchmarking Surface Henning D?scher Book 2013 Springer International Publishing Switzerland 2013 Anti-phase
描述Epitaxial integration of III-V semiconductors on silicon substrates has been desired over decades for high application potential in microelectronics, photovoltaics, and beyond. The performance of optoelectronic devices is still?severely impaired by critical defect mechanisms driven by the crucial polar-on-nonpolar heterointerface. This thesis?reports almost lattice-matched growth of thin gallium phosphide films as a viable model system for III-V/Si(100) interface investigations. The impact of antiphase disorder on the heteroepitaxial growth surface provides quantitative optical in situ access to one of the most notorious defect mechanisms, even in the vapor phase ambient common for compound semiconductor technology. Precise control over the surface structure of the Si(100) substrates prior to III-V nucleation prevents the formation of antiphase domains. The hydrogen-based process ambient enables the preparation of anomalous double-layer step structures on Si(100), highly beneficial for subsequent III-V integration.
出版日期Book 2013
關(guān)鍵詞Anti-phase Disorder; III-V Semiconductor Heteroepitaxy on Silicon Substrates; In Situ Reflectance Anis
版次1
doihttps://doi.org/10.1007/978-3-319-02880-4
isbn_softcover978-3-319-37955-5
isbn_ebook978-3-319-02880-4Series ISSN 2190-5053 Series E-ISSN 2190-5061
issn_series 2190-5053
copyrightSpringer International Publishing Switzerland 2013
The information of publication is updating

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https://doi.org/10.1007/978-1-349-11821-2s such as industrial scalability, reliable process control and established preparation of phosphorus containing III–V compounds, MOVPE has become the dominant process for the manufacture of laser diodes, multi-junction solar cells, and LEDs.
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Experimental,s such as industrial scalability, reliable process control and established preparation of phosphorus containing III–V compounds, MOVPE has become the dominant process for the manufacture of laser diodes, multi-junction solar cells, and LEDs.
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The First Five Psychotherapy Sessionsinterface necessitating a suitable substrate preparation prior to heteroepitaxy. New defect mechanisms—typically not observed in III–V homoepitaxy—arise from the interface with the Si(100) substrate and need to be controlled to achieve defect concentrations suitable for applications in advanced optoelectronic devices.
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