| 書目名稱 | Fundamentals of Electromigration-Aware Integrated Circuit Design |
| 編輯 | Jens Lienig,Matthias Thiele |
| 視頻video | http://file.papertrans.cn/351/350273/350273.mp4 |
| 概述 | Enables readers to understand and meet challenges of electromigration, including its effects on the reliability of electronic systems.Accessible to readers of varying backgrounds and experience levels |
| 圖書封面 |  |
| 描述 | .The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.. |
| 出版日期 | Book 2018 |
| 關(guān)鍵詞 | VLSI design; circuit design; electromigration; current density; physical design; interconnect reliability |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-319-73558-0 |
| isbn_softcover | 978-3-030-08811-8 |
| isbn_ebook | 978-3-319-73558-0 |
| copyright | Springer International Publishing AG 2018 |
|Archiver|手機(jī)版|小黑屋|
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