| 書目名稱 | Functional Design Errors in Digital Circuits |
| 副標題 | Diagnosis Correction |
| 編輯 | Kai-hui Chang,Igor L. Markov,Valeria Bertacco |
| 視頻video | http://file.papertrans.cn/350/349651/349651.mp4 |
| 概述 | Coverage of novel techniques to automate IC debugging, a subject rarely covered in other books.Comprehensive scope and solutions: from RTL to post-silicon debugging.The innovative techniques covered i |
| 叢書名稱 | Lecture Notes in Electrical Engineering |
| 圖書封面 |  |
| 描述 | .Functional Design Errors in Digital Circuits Diagnosis. covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.. |
| 出版日期 | Book 2009 |
| 關(guān)鍵詞 | Automatic debugging; Error diagnosis; Error repair; Post-silicon debugging; algorithms; circuit design; fo |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-1-4020-9365-4 |
| isbn_softcover | 978-90-481-8112-4 |
| isbn_ebook | 978-1-4020-9365-4Series ISSN 1876-1100 Series E-ISSN 1876-1119 |
| issn_series | 1876-1100 |
| copyright | Springer Science+Business Media B.V. 2009 |
|Archiver|手機版|小黑屋|
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