| 書目名稱 | Fault Diagnosis of Analog Integrated Circuits |
| 編輯 | Prithviraj Kabisatpathy,Alok Barua,Satyabroto Sinh |
| 視頻video | http://file.papertrans.cn/342/341476/341476.mp4 |
| 概述 | A valuable reference for Test Engineers and Analog IC designers.Includes supplementary material: |
| 叢書名稱 | Frontiers in Electronic Testing |
| 圖書封面 |  |
| 描述 | .System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In contrast, methodologies for the testing of analog circuits remain relatively underdeveloped due to the complex nature of analog signals. Compared to digital testing, analog testing lags far behind in methodologies and tools and therefore demands substantial research and development effort...Fault Diagnosis of Analog Integrated Circuits. is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. The objective of this book is to study the testing and fault diagnosis of analog and analog part of mixed signal circuits. A background in analog integrated circuit, artificial neural network is desirable but not essential...The text covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits. Fault model of the devices in analog domain has been introduced in the text. The test stimulus generations are also discussed in det |
| 出版日期 | Book 2005 |
| 關鍵詞 | Analog Integrated Circuit; Artificial Neural Network; Design for Test and Built-in-self-Test; FRET; Faul |
| 版次 | 1 |
| doi | https://doi.org/10.1007/b135977 |
| isbn_softcover | 978-1-4419-3828-2 |
| isbn_ebook | 978-0-387-25743-3Series ISSN 0929-1296 |
| issn_series | 0929-1296 |
| copyright | Springer-Verlag US 2005 |
|Archiver|手機版|小黑屋|
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