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Titlebook: Extraction of Semiconductor Diode Parameters; A Comparative Review Richard Ocaya Book 2024 The Editor(s) (if applicable) and The Author(s),

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書目名稱Extraction of Semiconductor Diode Parameters
副標(biāo)題A Comparative Review
編輯Richard Ocaya
視頻videohttp://file.papertrans.cn/320/319966/319966.mp4
概述Compares different parameter extraction methods to show strengths and weaknesses of each approach.Features a comprehensive and up-to-date review of the field for researchers and engineers.Provides com
圖書封面Titlebook: Extraction of Semiconductor Diode Parameters; A Comparative Review Richard Ocaya Book 2024 The Editor(s) (if applicable) and The Author(s),
描述.This book presents a comprehensive treatise on the extraction of semiconductor diode parameters using various methods. Its focus is on metal-semiconductor, metal-insulator-semiconductor, and p-n junction diodes, covering a wide range of metals and semiconductors, including elemental, compound, organic, and nanostructured materials. By bringing together these methods in one place, this book provides a much-needed standardized point of reference for the field...The methods used for device characterization have spread widely but not yet critically compared and contrasted. This book aims to bridge this gap by offering a comparative review of the methods and providing the most accurate information on current developments. The result is a valuable resource for researchers and practitioners who seek to optimize their use of semiconductor diodes in their work...With its thorough coverage and critical analysis, this book fills a large void in the field of semiconductor device characterization. It is an essential reference for anyone interested in the extraction of semiconductor diode parameters using a variety of methods.?.
出版日期Book 2024
關(guān)鍵詞Schottky Junctions; Semiconductor Diode Parameters; Metal-Semiconductor Diodes; Metal-Insulator Diodes;
版次1
doihttps://doi.org/10.1007/978-3-031-48847-4
isbn_softcover978-3-031-48849-8
isbn_ebook978-3-031-48847-4
copyrightThe Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Switzerl
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Contemporary Parameter Extraction Methods,n suggested, with varying complexity and utility. Here, we present a cross-section of the most recent electrical methods devised over the last decade. The methods are divided into three broad categories. These are current-voltage methods, capacitance-voltage (impedance) methods, and transport method
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A Novel Approach Based on Symmetry,barrier height, and built-in potential. It achieves this by reformulating the TE equation into an ordinary differential equation, revealing an unexpected symmetry that eliminates the series resistance term. Although the method’s derivation may appear complex, its practical application is straightfor
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Artifical Intelligence Parameter Extraction Methods,egression (LR), and Decision Tree (DT). These models are employed for the comprehensive analysis and extraction of internal parameters of Schottky photodiodes (SPDs), all while operating in the absence of any prior knowledge of the intricate and nonlinear thermionic emission (TE) expression governin
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https://doi.org/10.1007/978-3-031-48847-4Schottky Junctions; Semiconductor Diode Parameters; Metal-Semiconductor Diodes; Metal-Insulator Diodes;
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