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Titlebook: Extended Defects in Germanium; Fundamental and Tech Cor Claeys,Eddy Simoen Book 2009 Springer-Verlag Berlin Heidelberg 2009 Extended defect

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書目名稱Extended Defects in Germanium
副標(biāo)題Fundamental and Tech
編輯Cor Claeys,Eddy Simoen
視頻videohttp://file.papertrans.cn/320/319808/319808.mp4
概述Deals with all aspects of defects in Ge, an element which is gaining importance again in semiconductor technology.Discusses all kinds of expanded defects in Ge, such as dislocation, stacking faults, t
叢書名稱Springer Series in Materials Science
圖書封面Titlebook: Extended Defects in Germanium; Fundamental and Tech Cor Claeys,Eddy Simoen Book 2009 Springer-Verlag Berlin Heidelberg 2009 Extended defect
描述.The aim is to give an overview of the physics of extended defects in Germanium, i.e. dislocations (line defects), grain boundaries, stacking faults, twins and {311} defects (two-dimensional defects) and precipitates, bubbles, etc. The first part covers fundamentals, describing the crystallographic structure and other physical and electrical properties, mainly of dislocations. Since dislocations are essential for the plastic deformation of Germanium, methods for analysis and imaging of dislocations and to evaluate their structure are described. Attention is given to the electrical and optical properties, which are important for devices made in dislocated Ge. The second part treats the creation of extended defects during wafer and device processing. Issues are addressed such as defect formation during ion implantation, necessary to create junctions, which are an essential part in every device type. Extended defects are also created during the deposition of thin or thick epitaxial layers on other substrates, which are important for optoelectronic and photovoltaic applications. In brief, the book is intended to provide a fundamental understanding of the extended-defect formation durin
出版日期Book 2009
關(guān)鍵詞Extended defects; Germanium; Processing; Semiconductor devices; crystal; crystallography; physics
版次1
doihttps://doi.org/10.1007/978-3-540-85614-6
isbn_softcover978-3-642-09921-2
isbn_ebook978-3-540-85614-6Series ISSN 0933-033X Series E-ISSN 2196-2812
issn_series 0933-033X
copyrightSpringer-Verlag Berlin Heidelberg 2009
The information of publication is updating

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Sheung Ng,Kotaro Yoshida,Judith T. Zelikoff in covalent semiconductors [7,8]. The difference with a point-defect related deep level is that the energy position of the dislocation acceptor level shifts with its occupation due to the Coulomb repulsion between the electrons on the DB sites. At the same time the line charge induces a surrounding
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Germanium-Based Substrate Defects,ted in different ways, and the best known is by epitaxial deposition. Recently, some other methods have been developed, like the Ge condensation technique or direct wafer bonding, resulting in a Ge (or Ge-rich) layer on an insulator substrate. Because of the high lattice mismatch between Ge and Si,
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