Titlebook: Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits; Michael L. Bushnell,Vishwani D. Agrawal Textbook 2002

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協(xié)定

Fault Modelingg. Chapters 5 through 8 develop algorithms based on these. In addition,one must gain working knowledge of models used in testing of memory (Chapter 9) and analog circuits (Chapters 10 and 11.) Fault models most likely to gain significance in the near future are the delay fault models discussed in Chapter 12.

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遭遇

DSP-Based Analog and Mixed-Signal Testr most of the analog tests. It is important to understand that analog circuit testing is non-deterministic, and therefore the testing process is statistical and must also deal with electrical noise. As a proportion of total testing costs, the percentage due to analog testing is generally increasing.

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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

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