Titlebook: Erosion and Growth of Solids Stimulated by Atom and Ion Beams; G. Kiriakidis,G. Carter,J. L. Whitton Book 1986 Martinus Nijhoff Publishers

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浪蕩子

Wallow

The Theory of the Preferential Sputtering of Alloys, Including the Role of Gibbsian Segregation,ed situation in which the outermost atom layer shows a composition spike of one component while a depleted region begins at atom layer .. This situation is manifested in experimental profiles, in conflicting results between experiments done (for example) with Ion Scattering and Auger Electron Spectr

憤世嫉俗者

制度

On the Composition of the Sputtered Flux from Metal Targets and their Compounds,ms. This is no longer true for oxides as well as for targets with adsorbed oxygen on the surface. In addition, excited and ionized particles as well as molecules are sputtered under such conditions and their contribution to the sputtered flux can increase by orders of magnitude (1,2). This effect is

COLON

Geometric Methods of Analysis,ither accretion or erosion, but which have been utilised specifically in connection with the topographical modification of crystalline and amorphous solids subjected to energetic atom bombardment. Both the methods, and where appropriate, the mathematical theory are treated in chronological order, ev

COLON

Surface Topographical Evolution: Computational Methods of Analysis, some geometrical examples of developing surfaces have been described by Nobes.. For many practical applications however, where the characteristics are not straight lines, only computational models allow detailed quantitative calculations to be made. In three dimensions even when the characteristics

外面

俗艷

Experimental Studies of Morphology Development,f the approximately eight years of experimental investigation of ion beam-induced modification of metal surfaces made by myself and my many collaborators. A list of these collaborators and the many institutes involved is given in the Acknowledgements section. However, I would like to preface this co

POLYP

Investigation of Microtopography Induced during Sputter Depth Profiling of Ni/Cr Multilayered Strucental composition near surfaces. The electron and mass spectrometry in conjunction with ion sputter erosion allow one to probe the in-depth elemental composition near surfaces as well as the interfaces within the solids. In such a way the so called sputter depth profiles are obtained (1,2).