Titlebook: Ellipsometry of Functional Organic Surfaces and Films; Karsten Hinrichs,Klaus-Jochen Eichhorn Book 2018Latest edition Springer Internation

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Thickness and Beyond. Exploiting Spectroscopic Ellipsometry and Atomic Force Nanolithography for thence in the development of label-free detection techniques (quartz microbalance, surface plasmon resonance, electrochemical devices) for sensing and diagnostics. In this framework Spectroscopic Ellipsometry (SE) is an important player. In our approach to SE measurements on ultrathin soft matter, we e

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Polymer Brushes, Hydrogels, Polyelectrolyte Multilayers: Stimuli-Responsivity and Control of Proteinswelling of polymer films and protein adsorption processes thereon at varying ambient conditions. With ellipsometry in the VIS-range layer thickness and refractive index of the polymer layers can be evaluated. Appropriate models for in-situ measurements will be discussed and results of the influence

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Structure and Interactions of Polymer Thin Films from Infrared Ellipsometryo/chemical sensors and devices, organic electronics, as well as functional films with tunable surface characteristics. The films’ physical and chemical properties strongly correlate with structure and interactions, which also drive function and functionality. Infrared-spectroscopic ellipsometry (IR-

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Polarizing Natural Nanostructuresct this polarization. This is followed by a presentation of how animals and plants generate polarized light, usually through reflection from micro- and nanostructures. Special attention is made to scarab beetles reflecting light with a high degree of circular polarization. The use of Mueller matrix

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