找回密碼
 To register

QQ登錄

只需一步,快速開(kāi)始

掃一掃,訪(fǎng)問(wèn)微社區(qū)

打印 上一主題 下一主題

Titlebook: Electron Nano-Imaging; Basics of Imaging an Nobuo Tanaka Textbook 20171st edition Springer Japan KK 2017 Bethe Method.Cowley‘s Theory.Elect

[復(fù)制鏈接]
查看: 17523|回復(fù): 54
樓主
發(fā)表于 2025-3-21 17:22:49 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書(shū)目名稱(chēng)Electron Nano-Imaging
副標(biāo)題Basics of Imaging an
編輯Nobuo Tanaka
視頻videohttp://file.papertrans.cn/307/306138/306138.mp4
概述The first textbook for graduate students to explain the imaging mechanism of STEM in detail as well as TEM.Straightforward description focusing on imaging of TEM and STEM, by relegating supporting kno
圖書(shū)封面Titlebook: Electron Nano-Imaging; Basics of Imaging an Nobuo Tanaka Textbook 20171st edition Springer Japan KK 2017 Bethe Method.Cowley‘s Theory.Elect
描述.In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide fortoday’s graduate students and professionals just starting their careers..
出版日期Textbook 20171st edition
關(guān)鍵詞Bethe Method; Cowley‘s Theory; Electron Wave Optics; Energy-filtered Transmission Electron Microscopy; H
版次1
doihttps://doi.org/10.1007/978-4-431-56502-4
isbn_softcover978-4-431-56804-9
isbn_ebook978-4-431-56502-4
copyrightSpringer Japan KK 2017
The information of publication is updating

書(shū)目名稱(chēng)Electron Nano-Imaging影響因子(影響力)




書(shū)目名稱(chēng)Electron Nano-Imaging影響因子(影響力)學(xué)科排名




書(shū)目名稱(chēng)Electron Nano-Imaging網(wǎng)絡(luò)公開(kāi)度




書(shū)目名稱(chēng)Electron Nano-Imaging網(wǎng)絡(luò)公開(kāi)度學(xué)科排名




書(shū)目名稱(chēng)Electron Nano-Imaging被引頻次




書(shū)目名稱(chēng)Electron Nano-Imaging被引頻次學(xué)科排名




書(shū)目名稱(chēng)Electron Nano-Imaging年度引用




書(shū)目名稱(chēng)Electron Nano-Imaging年度引用學(xué)科排名




書(shū)目名稱(chēng)Electron Nano-Imaging讀者反饋




書(shū)目名稱(chēng)Electron Nano-Imaging讀者反饋學(xué)科排名




單選投票, 共有 1 人參與投票
 

0票 0.00%

Perfect with Aesthetics

 

0票 0.00%

Better Implies Difficulty

 

1票 100.00%

Good and Satisfactory

 

0票 0.00%

Adverse Performance

 

0票 0.00%

Disdainful Garbage

您所在的用戶(hù)組沒(méi)有投票權(quán)限
沙發(fā)
發(fā)表于 2025-3-21 20:20:09 | 只看該作者
Textbook 20171st edition explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which
板凳
發(fā)表于 2025-3-22 00:33:58 | 只看該作者
,Eine Lampe — schr?ge Schatten, probe and a scanning system seems different from TEM explained in previous chapters. The image intensity is equivalent to that by TEM due to the reciprocal theorem in optics. The STEM is nowadays recognized as a very effective tool for structural and chemical analyses of nanomaterials.
地板
發(fā)表于 2025-3-22 07:33:31 | 只看該作者
Nobuo TanakaThe first textbook for graduate students to explain the imaging mechanism of STEM in detail as well as TEM.Straightforward description focusing on imaging of TEM and STEM, by relegating supporting kno
5#
發(fā)表于 2025-3-22 11:26:16 | 只看該作者
6#
發(fā)表于 2025-3-22 14:57:22 | 只看該作者
7#
發(fā)表于 2025-3-22 21:02:45 | 只看該作者
What is Scanning Transmission Electron Microscopy (STEM)? probe and a scanning system seems different from TEM explained in previous chapters. The image intensity is equivalent to that by TEM due to the reciprocal theorem in optics. The STEM is nowadays recognized as a very effective tool for structural and chemical analyses of nanomaterials.
8#
發(fā)表于 2025-3-22 23:08:24 | 只看該作者
Einleitung und Begriffsdefinition,The word “Nano” in a part of the title of the present book is an abbreviation of nanometer (nm), which is the unit of length with a prefix in the International Standard of Unit (SI).
9#
發(fā)表于 2025-3-23 03:19:54 | 只看該作者
https://doi.org/10.1007/978-3-642-25702-5In this chapter, we overview the structure of a transmission electron microscope (TEM) for nanoimaging, and mathematical descriptions of basic actions of a magnetic round lens are explained.
10#
發(fā)表于 2025-3-23 06:03:03 | 只看該作者
 關(guān)于派博傳思  派博傳思旗下網(wǎng)站  友情鏈接
派博傳思介紹 公司地理位置 論文服務(wù)流程 影響因子官網(wǎng) 吾愛(ài)論文網(wǎng) 大講堂 北京大學(xué) Oxford Uni. Harvard Uni.
發(fā)展歷史沿革 期刊點(diǎn)評(píng) 投稿經(jīng)驗(yàn)總結(jié) SCIENCEGARD IMPACTFACTOR 派博系數(shù) 清華大學(xué) Yale Uni. Stanford Uni.
QQ|Archiver|手機(jī)版|小黑屋| 派博傳思國(guó)際 ( 京公網(wǎng)安備110108008328) GMT+8, 2025-10-20 06:50
Copyright © 2001-2015 派博傳思   京公網(wǎng)安備110108008328 版權(quán)所有 All rights reserved
快速回復(fù) 返回頂部 返回列表
庄浪县| 望都县| 东辽县| 光山县| 班戈县| 西乌| 湘潭市| 阿巴嘎旗| 天等县| 桐城市| 定兴县| 宁国市| 盱眙县| 东兰县| 大理市| 稷山县| 永新县| 民权县| 平南县| 攀枝花市| 万盛区| 师宗县| 仲巴县| 武夷山市| 光泽县| 阜南县| 阜新| 临湘市| 台中市| 三都| 雷波县| 神池县| 蓬安县| 沙坪坝区| 漠河县| 西畴县| 历史| 三门县| 皋兰县| 杭锦旗| 额尔古纳市|