Titlebook: Electron Microscopy of Polymers; Goerg H. Michler Book 2008 Springer-Verlag Berlin Heidelberg 2008 Copolymer.Elastomer.Polymer.Thin sectio

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Atomic Force Microscopya brief survey of the fundamentals and relevant applications of this technique to polymer research is presented in this chapter. Because of its special importance for polymer investigations, tappingmode atomic force microscopy will be described in detail, while other modes of operation will be introduced more briefly.

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Special Preparation Techniquesescribed. It is shown that this technique is particularly convenient for preparing ultrathin specimens of compositematerials that allow TEM analyses of interfaces of different classes of materials in their most undisturbed states.

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Preparation for (In Situ) Deformation Testsgation of fracture surfaces in the SEM and deformed samples by SEM, TEM or AFM. In particular, the preparation of semi-thin sections by (cryo)ultramicrotomy, mounting on a microtensile stage and investigation after deformation or in situ by TEM, ESEM or AFM are discussed.

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0945-6074 opy (AFM). The application of these techniques to the study of morphology and properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.978-3-642-07166-9978-3-540-36352-1Series ISSN 0945-6074 Series E-ISSN 2196-1174

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https://doi.org/10.1007/978-3-658-07458-6nation conditions and in particular the action of the objective lens and arranged apertures.This electron-optical imaging process, including microscope aberrations, is described in detail based on the wave-mechanical theory of contrast formation.

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Hochwasser-Katastrophenmanagementrientations of structural details, long periods, domain thicknesses, etc.) involve the use of Fourier analysis. The chapter also describes the application of stereoscopic imaging to show the topography of the sample surface, e.g. in scanning electron microscopy or optical microscopy.

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https://doi.org/10.1007/978-3-8348-9729-9tional methods are mentioned, and the applicabilities of various methods for studying themorphologies of several classes of polymers are summarized.All of these methods are described in detail in subsequent chapters in Part II.

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Transmission Electron Microscopy: Fundamentals of Methods and Instrumentationnation conditions and in particular the action of the objective lens and arranged apertures.This electron-optical imaging process, including microscope aberrations, is described in detail based on the wave-mechanical theory of contrast formation.

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