Titlebook: Electron Energy-Loss Spectroscopy in the Electron Microscope; R.F. Egerton Book 2011Latest edition Springer Science+Business Media, LLC 20

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Physics of Electron Scattering, term . meaning that any energy loss to the sample is not detectable experimentally. This criterion results in electron scattering by phonon excitation being classified as elastic (or quasielastic) when measurements are made using an electron microscope, where the energy resolution is rarely better

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TEM Applications of EELS,cimens, with the possibility of high spatial resolution. As in previous chapters, we begin with low-loss spectroscopy and energy filtering, followed by core-loss analysis and elemental mapping, including factors that determine detection sensitivity and spatial resolution. Structural information obta

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Bethe Theory for High Incident Energies and Anisotropic Materials,200?keV, however, an additional effect starts to become important, representing the fact that the electrostatic interaction is “retarded” due to the finite speed of light. At high incident energies and for isotropic materials, Eq. (3.26) should be replaced by (M?ller, 1932; Perez et al., 1977)

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Computer Programs, are designed as a supplement to Digital Micrograph scripts (Mitchell and Schaffer, 2005) and can be downloaded from . or from ..All are written in MATLAB script. A program to convert DigitalMicrograph data files into MATLAB format is available. As these programs may be updated from time to time, th

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