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Titlebook: Electron Crystallography; Douglas L. Dorset,Sven Hovm?ller,Xiaodong Zou Book 1997 Springer Science+Business Media Dordrecht 1997 X-ray cry

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發(fā)表于 2025-3-21 19:32:40 | 只看該作者 |倒序瀏覽 |閱讀模式
書目名稱Electron Crystallography
編輯Douglas L. Dorset,Sven Hovm?ller,Xiaodong Zou
視頻videohttp://file.papertrans.cn/307/306096/306096.mp4
叢書名稱NATO Science Series E:
圖書封面Titlebook: Electron Crystallography;  Douglas L. Dorset,Sven Hovm?ller,Xiaodong Zou Book 1997 Springer Science+Business Media Dordrecht 1997 X-ray cry
描述The re-emergent field of quantitative electron crystallographyis described by some of its most eminent practitioners. They describethe theoretical framework for electron scattering, specimenpreparation, experimental techniques for optimum data collection, themethodology of structure analysis and refinement, and a range ofapplications to inorganic materials (including minerals), linearpolymers, small organic molecules (including those used in nonlinearoptical devices), incommensurately modulated structures (includingsuperconductors), alloys, and integral membrane proteins. Theconnection between electron crystallography and X-ray crystallographyis clearly defined, especially in the utilisation of the latestmethods for direct determination of crystallographic phases, as wellas the unique role of image analysis of high-resolution electronmicrographs for phase determination. Even the aspect of multiple beamdynamic diffraction (once dreaded because it was thought to preclude.ab initio. analysis) is considered as a beneficial aid forsymmetry determination as well as the elucidation of crystallographicphases, and as a criterion for monitoring the progress of structurerefinement. Whereas ot
出版日期Book 1997
關鍵詞X-ray crystallography; crystal; crystallography; electron; polymer; scattering; structure
版次1
doihttps://doi.org/10.1007/978-94-015-8971-0
isbn_softcover978-90-481-4965-0
isbn_ebook978-94-015-8971-0Series ISSN 0168-132X
issn_series 0168-132X
copyrightSpringer Science+Business Media Dordrecht 1997
The information of publication is updating

書目名稱Electron Crystallography影響因子(影響力)




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沙發(fā)
發(fā)表于 2025-3-21 20:59:43 | 只看該作者
Convergent-Beam Electron DiffractionConvergent-beam electron diffraction (CBED) is a very powerful method for determing crystal symmetries, lattice defects and crystal structures of small specimen areas. We briefly describe the procedures of symmetry determination of crystals and structure refinement, and coherent effects using the CBED techniques.
板凳
發(fā)表于 2025-3-22 01:18:21 | 只看該作者
Reachability Trees for High-level Petri Netsan emphasis on their application in structure analysis, either by direct imaging or by diffraction. Electron microscopy can be done in transmission or in back-scatter mode. The back-scatter mode is used in scanning electron microscopy (SEM). The transmission mode is used in transmission electron microscopy (TEM).
地板
發(fā)表于 2025-3-22 05:38:57 | 只看該作者
Some Functional Investigative Problemsdvanced Study Institute on Electron Crystallography, but regrettably died half a year before it took place. Already in his classical book . from 1964 [1] he wrote: “There is no doubt now that electron diffraction may be used for the complete analysis of crystals whose structure is unknown”.
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發(fā)表于 2025-3-22 11:06:25 | 只看該作者
Higher Education Consumer Choicenstraints and restraints. It would be desirable to use refinement techniques in the structure solution as well, so as to incorporate chemical information into the phasing process. One such approach that looks very promising is ARP
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發(fā)表于 2025-3-22 22:47:49 | 只看該作者
Crystal Structure Refinement Incorporating Chemical Informationnstraints and restraints. It would be desirable to use refinement techniques in the structure solution as well, so as to incorporate chemical information into the phasing process. One such approach that looks very promising is ARP
9#
發(fā)表于 2025-3-23 03:31:30 | 只看該作者
978-90-481-4965-0Springer Science+Business Media Dordrecht 1997
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發(fā)表于 2025-3-23 07:36:07 | 只看該作者
Electron Crystallography978-94-015-8971-0Series ISSN 0168-132X
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