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Titlebook: EXAFS and Near Edge Structure III; Proceedings of an In Keith O. Hodgson,Britt Hedman,James E. Penner-Hahn Conference proceedings 19841st e

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書目名稱EXAFS and Near Edge Structure III
副標題Proceedings of an In
編輯Keith O. Hodgson,Britt Hedman,James E. Penner-Hahn
視頻videohttp://file.papertrans.cn/301/300639/300639.mp4
叢書名稱Springer Proceedings in Physics
圖書封面Titlebook: EXAFS and Near Edge Structure III; Proceedings of an In Keith O. Hodgson,Britt Hedman,James E. Penner-Hahn Conference proceedings 19841st e
描述This volume contains the Proceedings of the Third International EXAFS Conference, hosted by Stanford University and the Stanford Synchrotron Radiation Laboratory on July 16-20, 1984. The meeting, co-chaired by Professors Arthur Bienenstock and Keith Hodgson, was attended by over 200 scientists representing a wide range of scientific disciplines. The format of the meeting consisted of 51 invited presenta- tions and four days of poster sessions. This Proceedings is a compilation of 139 contributions from both invited speakers and authors of contributed posters. The last ten years has seen the rapid maturation of x-ray absorption spectrosco- pyas a scientific discipline. The vitality of the field is reflected in the diver- sity of applications found in the Proceedings. Recent work continues to probe the limits of x-ray spectroscopy, with proven techniques being extended to, for examp- le, very low or high energy studies, to very dilute systems, and to studies of surface structure. In fact, the title of the conference does not at all reflect the breadth of the science discussed at this meeting. The number of fields in which x- ray absorption spectroscopy is finding applications has inc
出版日期Conference proceedings 19841st edition
關(guān)鍵詞Absorption; Physik /Bericht; Structure; X-ray spectroscopy; spectroscopy; synchrotron radiation
版次1
doihttps://doi.org/10.1007/978-3-642-46522-2
isbn_softcover978-3-642-46524-6
isbn_ebook978-3-642-46522-2Series ISSN 0930-8989 Series E-ISSN 1867-4941
issn_series 0930-8989
copyrightSpringer-Verlag Berlin Heidelberg 1984
The information of publication is updating

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Conference proceedings 19841st editionery low or high energy studies, to very dilute systems, and to studies of surface structure. In fact, the title of the conference does not at all reflect the breadth of the science discussed at this meeting. The number of fields in which x- ray absorption spectroscopy is finding applications has inc
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Calculation of the Near Edge X-Ray Absorption Structure of Adsorbates by the Scattered Wave X, Methoomputation of the near edge structure of adsorbates within the framework of the Scattered Wave Xα method and illustrate the application of this technique by a calculation of the near edge structure at the carbon K edge of ethylene and ethylidyne (CCH.) on Pt(111).
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Die Rohmaterialien der Holzdestillation,wer energies, thus suggesting that edge structure which is unresolvable at the Mo K edge may be resolved at the L edges. An additional advantage of L edge spectroscopy is the ability to study both s and p symmetry initial states, thereby enhancing the electronic information which can be obtained.
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