Titlebook: ESD Design for Analog Circuits; Vladislav A. Vashchenko,Andrei Shibkov Book 2010 Springer Science+Business Media, LLC 2010 ESD.Electrostat

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雄偉

Conductivity Modulation in Semiconductor Structures Under Breakdown and Injection, In spite of the use of a variety of ESD protection devices and clamps for analog circuit protection, there are several fundamental physical effects taking place during a high-current ESD event. These effects are discussed in this chapter.

頂點

Standard and ESD Devices in Integrated Process Technologies,ctures. The purpose of Chapter 3 is to describe how these conductivity modulation phenomena are realized in both standard devices supported by electrical design rules of given integrated process technology and free ESD devices developed in the process..The pulsed safe-operating area (SOA) and physic

Sleep-Paralysis

prolate

ESD Network Design Principles,rotection circuit is usually composed of ESD protection clamps (cells) connected together in a way that provides a high current path for all of the pin-to-pin combinations. This network is engineered based on certain general principles and assumptions that are discussed below.

atopic

ESD Design for Signal Path Analog,. Two major categories of analog products are used as examples demonstrating ESD protection challenges and solutions: the signal path and the power management products. The first category is addressed in this chapter. Chapter 7 is focused on the specifics of power management products. These products

atopic

船員

System-Level and Discrete Components ESD,defined by different standards and specifications than component-level ESD requirements. Component-level ESD standards are specified to ensure ESD robustness of the integrated circuits and components during manufacturing and handling inside the controlled, protected ESD environment until the compone

enormous

Introduction,en in the field, as well as in EOS/ESD Symposium Proceedings [8]. The purpose of this section is to summarize the general ESD approach to integrated components design and provide condensed reference material related to the ESD pulse specification, and standards. Finally, the most important definitions used across this book are established.

馬籠頭

ESD Clamps,e feedback that is used to suppress the excessive positive feedback and limit uncontrollable current density increase. Thus, the ESD device structure combines the active device regions with blocking junctions, the drift region, RESURF regions, control electrodes, and the contacts.