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Titlebook: EMC of Analog Integrated Circuits; Jean-Michel‘Redouté,Michiel‘Steyaert Book 2010 Springer Science+Business Media B.V. 2010 Analog.Analog

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樓主: 頌歌
21#
發(fā)表于 2025-3-25 04:25:52 | 只看該作者
Kreuzungsanalyse bei diploiden Organismen,C at circuit level is shortly established and described. This description is far from complete; however, it summarizes the core ideas hidden behind practical standardized measurement setups. More importantly, it helps to fix the thought about what circuit elements play a significant role in the pick
22#
發(fā)表于 2025-3-25 08:50:55 | 只看該作者
23#
發(fā)表于 2025-3-25 13:23:34 | 只看該作者
https://doi.org/10.1007/978-3-8348-9277-5avior of output structures into two major families, namely output circuits of the common-drain type and those of the common-source type. It is shown mathematically that output circuits of the common-source type are much more immune to EMI compared to their common-drain counterparts. These observatio
24#
發(fā)表于 2025-3-25 19:07:27 | 只看該作者
https://doi.org/10.1007/978-3-8351-9105-1 that the immunity to EMI of an operational amplifier can significantly be increased by reducing the EMI induced offset generated in the input differential stage. After reviewing and studying existing EMI resisting differential input circuits as well as their respective advantages and disadvantages,
25#
發(fā)表于 2025-3-25 20:57:44 | 只看該作者
26#
發(fā)表于 2025-3-26 01:39:07 | 只看該作者
27#
發(fā)表于 2025-3-26 05:16:25 | 只看該作者
28#
發(fā)表于 2025-3-26 10:02:00 | 只看該作者
978-94-007-3088-5Springer Science+Business Media B.V. 2010
29#
發(fā)表于 2025-3-26 14:37:14 | 只看該作者
Basic EMC Concepts at IC Level,C at circuit level is shortly established and described. This description is far from complete; however, it summarizes the core ideas hidden behind practical standardized measurement setups. More importantly, it helps to fix the thought about what circuit elements play a significant role in the pick
30#
發(fā)表于 2025-3-26 19:44:14 | 只看該作者
EMC of Integrated Circuits versus Distortion,t, it is illustrated that EMI which is injected on nonlinear circuit nodes introduces nonlinear distortion. The worst EMI effect that appears is the EMI induced DC shift, which stems from an accumulation of even-order distortion components. EMI induced DC shift forms a potential threat to any electr
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