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Titlebook: Dynamic Characterisation of Analogue-to-Digital Converters; Dominique Dallet,José Machado Silva Book 2005 Springer-Verlag US 2005 Analog-D

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發(fā)表于 2025-3-21 16:55:36 | 只看該作者 |倒序瀏覽 |閱讀模式
書目名稱Dynamic Characterisation of Analogue-to-Digital Converters
編輯Dominique Dallet,José Machado Silva
視頻videohttp://file.papertrans.cn/284/283557/283557.mp4
概述Practical overview of Analog-to-Digital Converters.Includes supplementary material:
叢書名稱The Springer International Series in Engineering and Computer Science
圖書封面Titlebook: Dynamic Characterisation of Analogue-to-Digital Converters;  Dominique Dallet,José Machado Silva Book 2005 Springer-Verlag US 2005 Analog-D
描述.The Analogue-to-digital converter (ADC) is the most pervasive block in electronic systems. With the advent of powerful digital signal processing and digital communication techniques, ADCs are fast becoming critical components for system’s performance and flexibility. Knowing accurately all the parameters that characterise their dynamic behaviour is crucial, on one hand to select the most adequate ADC architecture and characteristics for each end application, and on the other hand, to understand how they affect performance bottlenecks in the signal processing chain...Dynamic Characterisation of Analogue-to-Digital Converters. presents a state of the art overview of the methods and procedures employed for characterising ADCs’ dynamic performance behaviour using sinusoidal stimuli. The three classical methods – histogram, sine wave fitting, and spectral analysis – are thoroughly described, and new approaches are proposed to circumvent some of their limitations...This is a must-have compendium, which can be used by both academics and test professionals to understand the fundamental mathematics underlining the algorithms of ADC testing, and as an handbook to help the engineer in the mo
出版日期Book 2005
關鍵詞Analog-Digital-Umsetzer; Analog-to-Digital Converters; Fitting; Phase; SECS; Signal; Sine Wave; Test Method
版次1
doihttps://doi.org/10.1007/b136458
isbn_softcover978-1-4419-3849-7
isbn_ebook978-0-387-25903-1Series ISSN 0893-3405
issn_series 0893-3405
copyrightSpringer-Verlag US 2005
The information of publication is updating

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0893-3405 heir limitations...This is a must-have compendium, which can be used by both academics and test professionals to understand the fundamental mathematics underlining the algorithms of ADC testing, and as an handbook to help the engineer in the mo978-1-4419-3849-7978-0-387-25903-1Series ISSN 0893-3405
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Dynamic Characterisation of Analogue-to-Digital Converters978-0-387-25903-1Series ISSN 0893-3405
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The Springer International Series in Engineering and Computer Sciencehttp://image.papertrans.cn/e/image/283557.jpg
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0893-3405 vasive block in electronic systems. With the advent of powerful digital signal processing and digital communication techniques, ADCs are fast becoming critical components for system’s performance and flexibility. Knowing accurately all the parameters that characterise their dynamic behaviour is cruc
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