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Titlebook: Developments in Applied Spectroscopy; Volume 7A Selected p E. L. Grove,Alfred J. Perkins Book 1969 Springer Science+Business Media New York

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樓主: 契約
31#
發(fā)表于 2025-3-26 21:00:03 | 只看該作者
onal Meeting of the Society of Applied Spectroscopy, held (in place of the 19th Mid-America Symposium on Spectroscopy) in Chicago, May 13-17, 1968. These papers, selected by the editors and reviewed by persons knowledgeable in the field, are those of the symposium type and not those pertaining to sp
32#
發(fā)表于 2025-3-27 03:20:45 | 只看該作者
33#
發(fā)表于 2025-3-27 08:30:50 | 只看該作者
https://doi.org/10.1007/978-1-4939-7328-6 spectra of these metals, gross structure introduced by self-absorption into the . spectra of the lanthanides, and wavelength shifts of . lines in lanthanum for near- threshold electron excitation. The significance of these changes for wavelength studies, elemental analysis, valance band studies, and chemical bonding will be discussed.
34#
發(fā)表于 2025-3-27 10:54:30 | 只看該作者
https://doi.org/10.1007/978-3-031-18038-5io of desired constituent to metal be stoichiometric and it is advantageous if this complex is extractable from aqueous solution with an immiscible organic solvent. Specific indirect methods for germanium, phosphorus, silicon, nitrate, thiocyanate, etc., will be discussed.
35#
發(fā)表于 2025-3-27 16:13:16 | 只看該作者
Application of X-Ray Topography to the Characterization of Semiconductor Surface Layersng, especially by high-temperature treatment. In this chapter, x-ray transmission and reflection topography methods applicable to surface study are described, with emphasis on surface-layer defects in silicon crystals used in the fabrication of microelectronic devices or circuits.
36#
發(fā)表于 2025-3-27 21:28:43 | 只看該作者
The Shift in Wavelength with Voltage of Certain X-Ray Lines spectra of these metals, gross structure introduced by self-absorption into the . spectra of the lanthanides, and wavelength shifts of . lines in lanthanum for near- threshold electron excitation. The significance of these changes for wavelength studies, elemental analysis, valance band studies, and chemical bonding will be discussed.
37#
發(fā)表于 2025-3-27 23:18:28 | 只看該作者
Indirect Atomic-Absorption Spectrometric Methods of Analysisio of desired constituent to metal be stoichiometric and it is advantageous if this complex is extractable from aqueous solution with an immiscible organic solvent. Specific indirect methods for germanium, phosphorus, silicon, nitrate, thiocyanate, etc., will be discussed.
38#
發(fā)表于 2025-3-28 02:34:57 | 只看該作者
Some Difficult Working Areas in Atomic-Absorption Flame Photometryence is discussed in detail and illustrated with experimental results obtained in the study of several frequent interference systems. Attention is given to calibration procedures and dataprocessing and representation.
39#
發(fā)表于 2025-3-28 09:54:48 | 只看該作者
https://doi.org/10.1007/978-3-030-96478-8 x-ray information may be obtained from such structures simultaneously. Attempts to calibrate the apparatus for carbon and oxygen layers on iron are discussed in some detail. The method appears well suited to the study of kinetic phenomena in surface films of mean thickness less than 100 ?.
40#
發(fā)表于 2025-3-28 14:06:37 | 只看該作者
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