書目名稱 | Design, Analysis and Test of Logic Circuits Under Uncertainty | 編輯 | Smita Krishnaswamy,Igor L. Markov,John P. Hayes | 視頻video | http://file.papertrans.cn/269/268801/268801.mp4 | 概述 | Presents a comprehensive overview of Logic Circuits.Combines theory with practical examples.Multi-discipline approach to the "hot" topic of uncertainty.Includes supplementary material: | 叢書名稱 | Lecture Notes in Electrical Engineering | 圖書封面 |  | 描述 | Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior. | 出版日期 | Book 2013 | 關(guān)鍵詞 | Fault-tolerance; Probabilistic logic; Reliability; Soft errors; Uncertainty | 版次 | 1 | doi | https://doi.org/10.1007/978-90-481-9644-9 | isbn_softcover | 978-94-007-9798-7 | isbn_ebook | 978-90-481-9644-9Series ISSN 1876-1100 Series E-ISSN 1876-1119 | issn_series | 1876-1100 | copyright | Springer Science+Business Media Dordrecht 2013 |
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