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Titlebook: Design for Manufacturability and Statistical Design; A Constructive Appro Michael Orshansky,Sani R. Nassif,Duane Boning Book 2008 Springer-

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樓主: dabble
31#
發(fā)表于 2025-3-27 00:44:29 | 只看該作者
Statistical Circuit Analysismplement Monte-Carlo . as an integral part of the simulator. In this chapter we review circuit simulation, explain the procedures through which the basic parameters defining the circuit are derived from observed data, and present two strategies for statistical circuit ..
32#
發(fā)表于 2025-3-27 02:11:53 | 只看該作者
Statistical Static Timing Analysisrect logical value require longer than the clock cycle of a device. Secondly it requires that the latching of the correct logical value be not pre-empted by any rapid propagation of the results of the previous clock cycle.
33#
發(fā)表于 2025-3-27 07:21:08 | 只看該作者
Leakage Variability And Joint Parametric Yieldd power variability. Both timing and power variation need to be accounted for in estimating the overall parametric yield. This chapter introduces a quantitative yield model that can accurately handle the correlation between timing and power variability.
34#
發(fā)表于 2025-3-27 11:03:27 | 只看該作者
Zur Dramaturgie des Fragebogens, an excellent thermal conductor. (2) The package in which the integrated circuit is sealed in order to protect it, and the connections between the packaged circuit and the external environment, through which the circuit is supplied with power as well as input and output signals.
35#
發(fā)表于 2025-3-27 14:14:52 | 只看該作者
36#
發(fā)表于 2025-3-27 21:07:03 | 只看該作者
Environmental Variability an excellent thermal conductor. (2) The package in which the integrated circuit is sealed in order to protect it, and the connections between the packaged circuit and the external environment, through which the circuit is supplied with power as well as input and output signals.
37#
發(fā)表于 2025-3-28 00:14:25 | 只看該作者
Parametric Yield Optimizationbility using robust and chance-constrained optimization formulations. These techniques permit efficient statistical circuit tuning using gate and transistor sizing and the use of multiple threshold voltages.
38#
發(fā)表于 2025-3-28 04:21:27 | 只看該作者
Book 2008 statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design
39#
發(fā)表于 2025-3-28 06:23:15 | 只看該作者
Interviewer- bzw. Befragtenhinweise,nerate additional types and sources of variation. The key impacts we are concerned with here are variations in the final interconnect or backend components of the chip, including variations in the . of the structures formed, and in the . of these structures.
40#
發(fā)表于 2025-3-28 13:45:24 | 只看該作者
Back End Variabilitynerate additional types and sources of variation. The key impacts we are concerned with here are variations in the final interconnect or backend components of the chip, including variations in the . of the structures formed, and in the . of these structures.
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