Titlebook: Design for Manufacturability and Statistical Design; A Constructive Appro Michael Orshansky,Sani R. Nassif,Duane Boning Book 2008 Springer-

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Front End Variabilityance of integrated circuits [6]. Several taxonomies can be used to describe the different variability mechanisms, according to their causes, spatial scales, the particular IC layer they impact, and whether their ability can be described using non-stochastic models. Here we briefly discuss these taxonomies.

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Statistical Foundations Of Data Analysis And Modelinges required are often different from those that are familiar to most circuit designers. In this chapter, we discuss some specific statistical concepts useful for statistical design. Along the way we will attempt to develop a more refined view of what variability is, and how to describe it in useful, formal, and unambiguous terms.

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https://doi.org/10.1007/978-0-387-69011-7Computer-Aided Design (CAD); Simulation; circuit design; data analysis; integrated circuit; modeling; opti

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Interviewer- bzw. Befragtenhinweise,uch as integrated inductors or capacitors formed within the interconnect process layers. Because the back end process shares many technologies and tools with the front end, many of the variations affecting the front end are also operative here, particularly those related to lithography and etch. In