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Titlebook: Design and Test of Integrated Inductors for RF Applications; Jaime Aguilera,Roc Berenguer Book 2003 Springer Science+Business Media New Yo

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發(fā)表于 2025-3-21 19:11:20 | 只看該作者 |倒序瀏覽 |閱讀模式
書目名稱Design and Test of Integrated Inductors for RF Applications
編輯Jaime Aguilera,Roc Berenguer
視頻videohttp://file.papertrans.cn/269/268607/268607.mp4
圖書封面Titlebook: Design and Test of Integrated Inductors for RF Applications;  Jaime Aguilera,Roc Berenguer Book 2003 Springer Science+Business Media New Yo
描述.Design and Test of Integrated Inductors for RF Applications. is intended for engineers who are starting out in the design of integrated inductors, this due to the fact that it describes the whole design flow, basic selection of the geometry, optimisation of the quality by redesigning the geometry, measurement and de-embedding and characterisation. Secondly it will help the designer with much experience in this field, this due to the fact that, based on empirical data, some design rules that have been widely used by the design community have been proved to be really conservative and breaking them leads up to higher quality designs.
出版日期Book 2003
關鍵詞Phase; Wafer; integrated circuit; model; simulation; tables
版次1
doihttps://doi.org/10.1007/b105291
isbn_softcover978-1-4419-5411-4
isbn_ebook978-0-306-48705-7
copyrightSpringer Science+Business Media New York 2003
The information of publication is updating

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發(fā)表于 2025-3-21 23:38:50 | 只看該作者
uctors, this due to the fact that it describes the whole design flow, basic selection of the geometry, optimisation of the quality by redesigning the geometry, measurement and de-embedding and characterisation. Secondly it will help the designer with much experience in this field, this due to the fa
板凳
發(fā)表于 2025-3-22 04:06:12 | 只看該作者
ct that, based on empirical data, some design rules that have been widely used by the design community have been proved to be really conservative and breaking them leads up to higher quality designs.978-1-4419-5411-4978-0-306-48705-7
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,Influence of the Geometric Parameters on the Inductor’s Performance: Design Rules,
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https://doi.org/10.1007/b105291Phase; Wafer; integrated circuit; model; simulation; tables
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