Titlebook: Defect and Fault Tolerance in VLSI Systems; Volume 2 C. H. Stapper,V. K. Jain,G. Saucier Book 1990 Springer Science+Business Media New York

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N.G. Stocks,A. Nikitin,R.P. MorseConsequently, models for yield analysis have been proposed for “l(fā)arge area clustering” and “small area clustering”. By adding a new parameter, the ., to the existing parameters of the defect distribution we unify the analysis of the existing models and at the same time add a whole range of “medium s

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Preliminaries: Basics and Notation,irectly from the circuit layout provide yield estimates for each circuit piece. Such simulations predict that random point defects will cause less than 1% of the 1266-transistor switches to fail. Yield estimates for each circuit piece are used as inputs to a yield model to evaluate the fault toleran

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Carsten Timmermann,Julie Anderson-out-of-n, k < n, unit group, called a block, is operated with k units being worked in the normal operation and the remaining (n-k) units being used as spares. The n switching parts in the block, instead of the traditional k ones, can also mask the faults in the switching part of the block. Under th

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Takahiro Ueyama,Christophe Lécuyerrchitectures are often used in highly dependable systems. However, these architectures have several drawbacks for onboard equipments: cost, weight, volume, power consumption and dissipation often lead to difficult problems. In other respects, if duplex architectures allow to reduce some of these pro

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Devices for Cardiac Resynchronization: to prevent a consistent reduction of the production yield and a short functioning life of devices. These problems become particularly important when the application is critical and maintenance is difficult or impossible. In the APES environment some tools are available to evaluate statistically the

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https://doi.org/10.1007/978-981-13-0782-9 reconfigurable chips in which there are redundant elements that can be used to replace the defective elements. The fault covering problem is to assign redundant elements to replace the defective elements such that the chip will function properly. A general formulation to represent the relationship

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https://doi.org/10.1007/978-981-13-0782-9ith spare rows and columns. By studying the probability of successful application of these heuristics, we are able to make statements about their average performance. Finally, an algorithm which almost always runs in polynomial time based on an appropriate failure rate is presented.