書(shū)目名稱 | Defect Sizing Using Non-destructive Ultrasonic Testing |
副標(biāo)題 | Applying Bandwidth-D |
編輯 | Wolf Kleinert |
視頻video | http://file.papertrans.cn/265/264716/264716.mp4 |
概述 | Presents an approach to bring both sizing methods DGS and DAC close together.Proposes an idea to increase sizing methods productivity significantly.Author with 30+ years experience working in industry |
圖書(shū)封面 |  |
描述 | This book presents a precise approach for defect sizing using ultrasonics. It describes an alternative to the current European and American standards by neglecting their limitations. The approach presented here is not only valid for conventional angle beam probes, but also for phased array angle beam probes. It introduces an improved method which provides a significant productivity gain and calculates curves with high accuracy. Its content is of interest to all those working with distance gain size (DGS) methods or are using distance amplitude?correction (DAC) curves. |
出版日期 | Book 2016 |
關(guān)鍵詞 | Distance Amplitude Correction; Distance Gain Size; Non-destructing Testing; Reflector Sizing; Standardiz |
版次 | 1 |
doi | https://doi.org/10.1007/978-3-319-32836-2 |
isbn_softcover | 978-3-319-81379-0 |
isbn_ebook | 978-3-319-32836-2 |
copyright | Springer International Publishing Switzerland 2016 |