找回密碼
 To register

QQ登錄

只需一步,快速開始

掃一掃,訪問微社區(qū)

打印 上一主題 下一主題

Titlebook: Debugging at the Electronic System Level; Frank Rogin,Rolf Drechsler Book 2010 Springer Science+Business Media B.V. 2010 ESL Debugging.Ele

[復(fù)制鏈接]
查看: 12663|回復(fù): 38
樓主
發(fā)表于 2025-3-21 19:53:45 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書目名稱Debugging at the Electronic System Level
編輯Frank Rogin,Rolf Drechsler
視頻videohttp://file.papertrans.cn/265/264090/264090.mp4
概述Currently, no other book is known to us that considers debugging for ESL designs.Debugging is still a manual and unsystematic process. Every technique, that helps the designer to improve and accelerat
圖書封面Titlebook: Debugging at the Electronic System Level;  Frank Rogin,Rolf Drechsler Book 2010 Springer Science+Business Media B.V. 2010 ESL Debugging.Ele
描述Debugging becomes more and more the bottleneck to chip design productivity, especially while developing modern complex integrated circuits and systems at the Electronic SystemLevel (ESL). Today, debugging is still an unsystematic and lengthy process. Here, a simple reporting of a failure is not enough, anymore. Rather, it becomes more and more important not only to find many errors early during development but also to provide efficient methods for their isolation.In .Debugging at the Electronic System Level. the state-of-the-art of modeling and verification of ESL designs is reviewed. There, a particular focus is taken onto SystemC. Then, a reasoning hierarchy is introduced. The hierarchy combines well-known debugging techniques with whole new techniques to improve the verification efficiency at ESL. The proposed systematic debugging approach is supported amongst others by static code analysis, debug patterns, dynamic program slicing, design visualization, property generation, and automatic failure isolation. All techniques were empirically evaluated using real-world industrial designs. Summarized, the introduced approach enables a systematic search for errors in ESL designs. Here,
出版日期Book 2010
關(guān)鍵詞ESL Debugging; Electronic System Level (ESL); SystemC; debugging techniques; design automation; electroni
版次1
doihttps://doi.org/10.1007/978-90-481-9255-7
isbn_softcover978-94-007-9507-5
isbn_ebook978-90-481-9255-7
copyrightSpringer Science+Business Media B.V. 2010
The information of publication is updating

書目名稱Debugging at the Electronic System Level影響因子(影響力)




書目名稱Debugging at the Electronic System Level影響因子(影響力)學(xué)科排名




書目名稱Debugging at the Electronic System Level網(wǎng)絡(luò)公開度




書目名稱Debugging at the Electronic System Level網(wǎng)絡(luò)公開度學(xué)科排名




書目名稱Debugging at the Electronic System Level被引頻次




書目名稱Debugging at the Electronic System Level被引頻次學(xué)科排名




書目名稱Debugging at the Electronic System Level年度引用




書目名稱Debugging at the Electronic System Level年度引用學(xué)科排名




書目名稱Debugging at the Electronic System Level讀者反饋




書目名稱Debugging at the Electronic System Level讀者反饋學(xué)科排名




單選投票, 共有 0 人參與投票
 

0票 0%

Perfect with Aesthetics

 

0票 0%

Better Implies Difficulty

 

0票 0%

Good and Satisfactory

 

0票 0%

Adverse Performance

 

0票 0%

Disdainful Garbage

您所在的用戶組沒有投票權(quán)限
沙發(fā)
發(fā)表于 2025-3-22 00:17:11 | 只看該作者
Summary and Conclusion,ure-causing bug still remains an unsystematic and time-consuming process. So, it becomes important not only to find many errors early during development. Rather, new methods and approaches have to be provided that improve and support an automation of debugging.
板凳
發(fā)表于 2025-3-22 02:52:24 | 只看該作者
地板
發(fā)表于 2025-3-22 04:51:26 | 只看該作者
5#
發(fā)表于 2025-3-22 11:52:15 | 只看該作者
Book 2010alysis, debug patterns, dynamic program slicing, design visualization, property generation, and automatic failure isolation. All techniques were empirically evaluated using real-world industrial designs. Summarized, the introduced approach enables a systematic search for errors in ESL designs. Here,
6#
發(fā)表于 2025-3-22 14:10:08 | 只看該作者
7#
發(fā)表于 2025-3-22 17:50:43 | 只看該作者
8#
發(fā)表于 2025-3-23 01:05:19 | 只看該作者
9#
發(fā)表于 2025-3-23 01:59:47 | 只看該作者
10#
發(fā)表于 2025-3-23 07:27:55 | 只看該作者
 關(guān)于派博傳思  派博傳思旗下網(wǎng)站  友情鏈接
派博傳思介紹 公司地理位置 論文服務(wù)流程 影響因子官網(wǎng) 吾愛論文網(wǎng) 大講堂 北京大學(xué) Oxford Uni. Harvard Uni.
發(fā)展歷史沿革 期刊點(diǎn)評 投稿經(jīng)驗(yàn)總結(jié) SCIENCEGARD IMPACTFACTOR 派博系數(shù) 清華大學(xué) Yale Uni. Stanford Uni.
QQ|Archiver|手機(jī)版|小黑屋| 派博傳思國際 ( 京公網(wǎng)安備110108008328) GMT+8, 2025-10-12 05:37
Copyright © 2001-2015 派博傳思   京公網(wǎng)安備110108008328 版權(quán)所有 All rights reserved
快速回復(fù) 返回頂部 返回列表
威信县| 晋城| 徐汇区| 丰镇市| 甘洛县| 丰顺县| 静乐县| 兴仁县| 子长县| 盐山县| 襄汾县| 天峻县| 桐乡市| 灌南县| 靖宇县| 顺义区| 清远市| 扶绥县| 麻江县| 盐边县| 嘉黎县| 洪江市| 鄂州市| 尉氏县| 卢龙县| 扶沟县| 鄂州市| 景宁| 博乐市| 恩施市| 龙海市| 金坛市| 汽车| 五河县| 远安县| 历史| 鄂尔多斯市| 介休市| 惠安县| 昭平县| 乐东|