Titlebook: Debug Automation from Pre-Silicon to Post-Silicon; Mehdi Dehbashi,G?rschwin Fey Book 2015 Springer International Publishing Switzerland 20

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ware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level;.Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to 978-3-319-35610-5978-3-319-09309-3

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Summary and Outlook to time-to-market constraints, 100?% verification coverage at the design level is an elusive task. Consequently, automated debugging approaches are required at both pre-silicon and post-silicon stages in order to reduce the development time of IC products.

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https://doi.org/10.1007/978-3-531-91774-0rent applications in embedded systems such as medical electronics, automotive systems and avionics. A failure of a chip in non-critical applications may cause significant economical loss while in critical applications may also threaten the human life in the worst case. Consequently, the correct desi

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