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Titlebook: Crystal Structure Determination; Werner Massa Textbook 20001st edition Springer-Verlag Berlin Heidelberg 2000 Kristall.Kristallographie.Pu

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書目名稱Crystal Structure Determination
編輯Werner Massa
視頻videohttp://file.papertrans.cn/241/240642/240642.mp4
概述Traditional and up-to-date approach;.Specific reference to the very widely used SHELX Programs of George Sheldrick, University of G?ttingen;.Based on lectures held at the university for many years;.So
圖書封面Titlebook: Crystal Structure Determination;  Werner Massa Textbook 20001st edition Springer-Verlag Berlin Heidelberg 2000 Kristall.Kristallographie.Pu
描述To solve a crystal structure means to determine the precise spatial arrangements of all of the atoms in a chemical compound in the crystalline state. This knowledge gives a chemist access to a large range of information, induding connectivity, conformation, and accurate bond lengths and angles. In addition, it implies the stoichiometry, the density, the symmetry and the three dimensional packing of the atoms in the solid. Since interatomic distances are in the region of 100-300 pm or 1-3 A, I microscopy using visible light ( wavelength Je ca. 300-700 nm) is not applicable (Fig. l. l). In 1912, Max von Laue showed that crystals are based on a three dimensional lattice which scatters radiation with a wavelength in the vicinity of interatomic distances, i. e. X -rays with Je = 50-300 pm. The process by wh ich this radiation, without changing its wave- length, is converted through interference by the lattice to a vast number of observable "reflections" with characteristic directions in space is called X-ray diffraction. The method by which the directions and the intensities of these reflections are measured, and the ordering of the atoms in the crystal deduced from them, is called X -r
出版日期Textbook 20001st edition
關(guān)鍵詞Kristall; Kristallographie; Pulverdiagramm; R?ntgenanalyse; R?ntgendiffraktion; Strukturbestimmung; X-ray
版次1
doihttps://doi.org/10.1007/978-3-662-04248-9
isbn_ebook978-3-662-04248-9
copyrightSpringer-Verlag Berlin Heidelberg 2000
The information of publication is updating

書目名稱Crystal Structure Determination影響因子(影響力)




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Textbook 20001st editionce by the lattice to a vast number of observable "reflections" with characteristic directions in space is called X-ray diffraction. The method by which the directions and the intensities of these reflections are measured, and the ordering of the atoms in the crystal deduced from them, is called X -r
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Errors and Pitfalls, structure model largely reflects reality, and gives a credible .-factor although some small, but possibly important, parts of the structure are wrong. These can arise, for example, when the refinement converges not to the . but to a local . In such a case, a solution has been obtained which contain
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Springer-Verlag Berlin Heidelberg 2000
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