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Titlebook: Copper Interconnect Technology; Tapan Gupta Book 2009 Springer-Verlag New York 2009 circuit performance.copper/low-k technology.cu interco

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11#
發(fā)表于 2025-3-23 09:54:44 | 只看該作者
Coping and Living with Cervical Cancer,, better performance of the scaled circuits, and thinner gate material need better dielectric materials other than silicon dioxide (SiO.). As a result, copper has replaced Al-interconnect and low. interlayer and high. gate dielectric materials have replaced SiO.. Deep submicron copper interconnects
12#
發(fā)表于 2025-3-23 15:13:36 | 只看該作者
13#
發(fā)表于 2025-3-23 21:56:16 | 只看該作者
TVET and Ecologism: Charting New Terrained capacitive reactance of the interconnecting lines. The conductivity of copper (σ. = 0.598 ohm-cm and σ . = 0.374 ohm-cm) is higher and it offers higher resistance to electromigration (EM) compared to aluminum (or Al-alloy). At the same time, copper has the advantage of making finer wires with low
14#
發(fā)表于 2025-3-24 00:20:17 | 只看該作者
15#
發(fā)表于 2025-3-24 04:48:39 | 只看該作者
Coping and Living with Cervical Cancer,s the additional . reduction [.–.]. Unfortunately, as the thickness of the gate oxide becomes very thin because of the scaling down of channel length, quantum mechanical . occurs for voltages below the Si/SiO. barrier height which is approximately 3.1 eV [.–.] (.).
16#
發(fā)表于 2025-3-24 07:04:08 | 只看該作者
Book 2009on transistors as well. During the last decade, however, the parasitic resistance, capacitance, and inductance associated with interconnections began to influence circuit performance and will be the primary factors in the evolution of nanoscale ULSI technology. Because metallic conductivity and resi
17#
發(fā)表于 2025-3-24 14:41:36 | 只看該作者
Introduction,c material) to separate the .. Besides being an insulating material for interconnecting lines, SiO. has been used also as a gate material in metal oxide semiconductor (MOS) devices. As a matter of fact, Al coupled with SiO. has become the workhorse of IC technology.
18#
發(fā)表于 2025-3-24 15:17:01 | 只看該作者
Pattern Generation,et (DUV) lithography. Figure 4.1 shows a picture of the trenches produced by using DUV resist and phase-shift mask (PSM). The resist images show a .. factor as small as 0.25 (the 2004 ITRS requirement for technology node is . and is expected to be . by the year 2007, where .).
19#
發(fā)表于 2025-3-24 19:48:36 | 只看該作者
The Copper Damascene Process and Chemical Mechanical Polishing,process of decorating a metal with wavy patterns of gold or silver. However, in integrated circuits (ICs) the . means an elegant technique of inlaying metal (copper) for interconnect which avoids the complicated process of metal etching.
20#
發(fā)表于 2025-3-25 01:11:19 | 只看該作者
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