| 書(shū)目名稱 | Contactless VLSI Measurement and Testing Techniques |
| 編輯 | Selahattin Sayil |
| 視頻video | http://file.papertrans.cn/237/236288/236288.mp4 |
| 概述 | Provides a single-source reference on contactless probing approaches for VLSI testing and diagnostic measurement.Introduces readers to various optical contactless testing techniques, such as Electro-O |
| 圖書(shū)封面 |  |
| 描述 | .This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing.? The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing. The techniques described in this book address the increasing demands for internal access of the logic state of a node within a chip under test.. |
| 出版日期 | Book 2018 |
| 關(guān)鍵詞 | Integrated Circuit Reliability; Integrated Circuit Test Engineering; VLSI Test Principles and Architec |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-319-69673-7 |
| isbn_softcover | 978-3-319-88819-4 |
| isbn_ebook | 978-3-319-69673-7 |
| copyright | Springer International Publishing AG 2018 |
|Archiver|手機(jī)版|小黑屋|
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