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Titlebook: Computer Processing of Electron Microscope Images; Peter W. Hawkes Book 1980 Springer-Verlag Berlin Heidelberg 1980 Bildverarbeitung.Elekt

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書(shū)目名稱Computer Processing of Electron Microscope Images
編輯Peter W. Hawkes
視頻videohttp://file.papertrans.cn/234/233699/233699.mp4
叢書(shū)名稱Topics in Current Physics
圖書(shū)封面Titlebook: Computer Processing of Electron Microscope Images;  Peter W. Hawkes Book 1980 Springer-Verlag Berlin Heidelberg 1980 Bildverarbeitung.Elekt
描述Towards the end of the 1960s, a number of quite different circumstances combined to launch a period of intense activity in the digital processing of electron micro- graphs. First, many years of work on correcting the resolution-limiting aberrations of electron microscope objectives had shown that these optical impediments to very high resolution could indeed be overcome, but only at the cost of immense exper- imental difficulty; thanks largely to the theoretical work of K. -J. Hanszen and his colleagues and to the experimental work of F. Thon, the notions of transfer func- tions were beginning to supplant or complement the concepts of geometrical optics in electron optical thinking; and finally, large fast computers, capable of manipu- lating big image matrices in a reasonable time, were widely accessible. Thus the idea that recorded electron microscope images could be improved in some way or rendered more informative by subsequent computer processing gradually gained ground. At first, most effort was concentrated on three-dimensional reconstruction, particu- larly of specimens with natural symmetry that could be exploited, and on linear operations on weakly scattering specimens (C
出版日期Book 1980
關(guān)鍵詞Bildverarbeitung; Elektronenmikroskopie; Natur; computer; electron microscope; optics; complexity
版次1
doihttps://doi.org/10.1007/978-3-642-81381-8
isbn_softcover978-3-642-81383-2
isbn_ebook978-3-642-81381-8Series ISSN 0342-6793
issn_series 0342-6793
copyrightSpringer-Verlag Berlin Heidelberg 1980
The information of publication is updating

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Matthew E. Keith,Amanda M. Evansdefocus combines with the specimen scattering to provide some image contrast. The action of the spherical aberration and defocus is analogous to that of a phase plate of variable thickness in the radial direction and this type of contrast is therefore phase contrast. Unfortunately, owing to the nonu
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Image Processing Based on the Linear Theory of Image Formation,defocus combines with the specimen scattering to provide some image contrast. The action of the spherical aberration and defocus is analogous to that of a phase plate of variable thickness in the radial direction and this type of contrast is therefore phase contrast. Unfortunately, owing to the nonu
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0342-6793 imensional reconstruction, particu- larly of specimens with natural symmetry that could be exploited, and on linear operations on weakly scattering specimens (C978-3-642-81383-2978-3-642-81381-8Series ISSN 0342-6793
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The Binary Relationship of Sea and Land,d light to be treated in projection, and produces no more than slight attenuation and phase shifting of the incident electron beam. This limit is an increasingly close approximation as accelerating voltage and resolution increase; it is an approximation at best, however, and is sometimes simply unte
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Problems and Methods of Archaeometallurgy, X-ray crystallography. Basically the electron microscope is equivalent to a diffractometer, since the specimen is illuminated by a parallel primary beam with a well-defined wavelength and orientation. The Fourier inversion of an electron micrograph delivers the distorted structure factors in a well
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