Titlebook: Chemistry and Physics of Solid Surfaces VI; Ralf Vanselow,Russell Howe Textbook 1986 Springer-Verlag Berlin Heidelberg 1986 catalysis.chem

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The Time-of-Flight Atom-Probe and Its Application to Surface Analysis and Gas-Surface Interactions,identity of these atoms can be determined. This high-voltage pulse atom-probe is very useful for the microanalysis of materials, especially for metals and alloys where field evaporation proceeds from plane edges, atom by atom. Thus, atomic layer by atomic layer compositional analysis can be carried

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Field Emission Microscopy - Trends and Perspectives,f modest proportions) of activity. Optical microscopy generally was relegated to use as a test for surface smoothness by the metallographer in preparing a surface for subsequent surface study, or on a few occasions was used in an actual surface investigation. Electron microscopy was occasionally use

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Scanning Tunneling Microscopy,tion of the STM. The following section then deals with different applications and examples of surface microscopy. It also contains a brief look at other applications of the STM. In the fifth section we focus on spectroscopic data, i.e., results on the electronic structure of the surface. The conclus

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