Titlebook: Chemisch-technologisches Rechnen; Ferdinand Fischer,Fr. Hartner (Fabrikdirektor) Book 1912Latest edition Springer-Verlag Berlin Heidelberg

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THE NATURES OF POINT DEFECTS IN AMORPHOUS SILICON DIOXIDEd voltage shifts in MOS transistors. It is easy to imagine how improvements in identification and control of these defects could result in billions of dollars in cost savings to photonics and semiconductor industries over the next decade.