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Titlebook: Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale; Renzo Rosei Book 1997 Springer Science+Business

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發(fā)表于 2025-3-21 16:52:43 | 只看該作者 |倒序瀏覽 |閱讀模式
書目名稱Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale
編輯Renzo Rosei
視頻videohttp://file.papertrans.cn/225/224498/224498.mp4
叢書名稱NATO Science Series E:
圖書封面Titlebook: Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale;  Renzo Rosei Book 1997 Springer Science+Business
描述An assessment of the recent achievements and relative strengthsof two developing techniques for characterising surfaces at thenanometer scale: (i) local probe methods, including scanningtunnelling microscopy and its derivatives; and (ii) nanoscalephotoemission and absorption spectroscopy for chemical analysis. .The keynote lectures were delivered by some of the world‘s bestscientists in the field and some of the topics covered include: (1)The possible application of STM in atomically resolved chemicalanalysis. (2) The principles of scanning force/friction and scanningnear-field optical microscopes. (3) The scanning photoemissionelectron microscopes built at ELETTRA and SRRC, with a description ofsynchrotron radiation microscopy. (4) Recent progress in thedevelopment of spatially-resolved photoelectron microscopy, especiallythe use of zone plate photon optics. (5) The present status ofnon-scanning photoemission microscopy with slow electrons. (6) theBESSY 2 project for a non-scanning photoelectron microscope withelectron optics. (7) Spatially-resolved .in situ. reaction studiesof chemical waves and oscillatory phenomena with the UV photoemissionmicroscope.
出版日期Book 1997
關(guān)鍵詞LEEM; PEEM; PES; SNOM; STM; electron microscope; electron microscopy; microscopy; spectroscopy
版次1
doihttps://doi.org/10.1007/978-94-011-5724-7
isbn_softcover978-94-010-6414-9
isbn_ebook978-94-011-5724-7Series ISSN 0168-132X
issn_series 0168-132X
copyrightSpringer Science+Business Media Dordrecht 1997
The information of publication is updating

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發(fā)表于 2025-3-21 20:36:15 | 只看該作者
Past Triumphs, Future Challenges,hanical properties of sample surfaces. The near-field optical microscope on the other hand measures the reflectivity, absorption or the fluorescence near the sample surface. As an application we discuss the imaging of polymer surfaces.
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SFFM and SNOM of Heterogeneous Materials,hanical properties of sample surfaces. The near-field optical microscope on the other hand measures the reflectivity, absorption or the fluorescence near the sample surface. As an application we discuss the imaging of polymer surfaces.
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Book 1997-scanning photoemission microscopy with slow electrons. (6) theBESSY 2 project for a non-scanning photoelectron microscope withelectron optics. (7) Spatially-resolved .in situ. reaction studiesof chemical waves and oscillatory phenomena with the UV photoemissionmicroscope.
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Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale978-94-011-5724-7Series ISSN 0168-132X
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C. A. Lunn,M. Takahara,M. Inouye, metals, semiconductors, superconductors, molecular and biological systems, and adsorbed layers [2]. Here we present two new applications in the study of two-and lower-dimensional electron systems involving electrons in surface states of semiconductors and metals. First, STM tip-sample electrical p
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